Shielding methodologies in the presence of power/ground noise

S Kose, E Salman, EG Friedman - IEEE Transactions on Very …, 2010 - ieeexplore.ieee.org
Design guidelines for shielding in the presence of power/ground (P/G) noise are presented
in this paper. The effect of P/G noise on crosstalk is analyzed for different line lengths, line …

Evaluation and reduction of signal integrity issues in multiwalled carbon nanotube on-chip VLSI interconnects

R Mudavath, BR Naik, JP Raj - ECS Journal of Solid State …, 2021 - iopscience.iop.org
Due to advancements in device scaling in very-large-scale integration (VLSI) technology,
signal integrity (SI) issues play a major role to determining the performance of on-chip …

VLSI interconnects and their testing: prospects and challenges ahead

DK Sharma, BK Kaushik, RK Sharma - Journal of Engineering, Design …, 2011 - emerald.com
Purpose–The purpose of this paper is to explore the functioning of very‐large‐scale
integration (VLSI) interconnects and modeling of interconnects and evaluate different …

Interconnect noise analysis and optimization in deep submicron technology

MA Elgamel, MA Bayoumi - IEEE Circuits and Systems …, 2003 - ieeexplore.ieee.org
The migration to using ultra deep submicron (UDSM) process, 0.25 μm or below,
necessitates new design methodologies and EDA tools to address the new design …

Post-route gate sizing for crosstalk noise reduction

MR Becer, D Blaauw, I Algor, R Panda, C Oh… - Proceedings of the 40th …, 2003 - dl.acm.org
Gate sizing is a practical and a feasible crosstalk noise repair technique in the post route
design stage, especially for block level sea-of-gates designs. The difficulty in gate sizing for …

Modeling single event crosstalk in nanometer technologies

S Sayil, VK Boorla, SR Yeddula - IEEE Transactions on Nuclear …, 2011 - ieeexplore.ieee.org
With advances in CMOS technology, circuits become increasingly more sensitive to transient
pulses caused by single event (SE) particles. On the other hand, coupling effects among …

[图书][B] Compact models and performance investigations for subthreshold interconnects

R Dhiman, R Chandel - 2015 - Springer
Modern very-large-scale integration (VLSI) chips contain millions of transistors. It is
envisaged that VLSI chips will contain more than three billion transistors in the coming …

[PDF][PDF] Noise reduction in VLSI circuits using modified GA based graph coloring

T Maitra, AJ Pal, D Bhattacharyya… - International Journal of …, 2010 - researchgate.net
Analyzing and evaluating various noise avoidance techniques such as driver sizing, wire
sizing, wire spacing and layer assignment. This paper presents an approach to solve the …

Early probabilistic noise estimation for capacitively coupled interconnects

MR Becer, D Blaauw, IN Hajj, R Panda - Proceedings of the 2002 …, 2002 - dl.acm.org
One of the critical challenges in today's high performance IC design is to take noise into
account as early as possible in the design cycle. Current noise analysis tools [1, 7} are …

Using binary-reflected gray coding for crosstalk mitigation of network on chip

Z Shirmohammadi, SG Miremadi - The 17th CSI International …, 2013 - ieeexplore.ieee.org
This paper proposes an efficient crosstalk mitigation method for Network-on-Chips. This
method uses the binary-reflected Gray coding to send the proper code word into a channel …