Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook

M Botifoll, I Pinto-Huguet, J Arbiol - Nanoscale Horizons, 2022 - pubs.rsc.org
In the last few years, electron microscopy has experienced a new methodological paradigm
aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine …