N-polar GaN epitaxy and high electron mobility transistors

MH Wong, S Keller, SD Nidhi… - Semiconductor …, 2013 - iopscience.iop.org
This paper reviews the progress of N-polar ($000\mathop 1\limits^\_ $) GaN high frequency
electronics that aims at addressing the device scaling challenges faced by GaN high …

Dislocations and their reduction in GaN

SE Bennett - Materials Science and Technology, 2010 - Taylor & Francis
Gallium nitride (GaN) is a semiconductor used to make light emitting diodes, a technology
that could decrease global energy demands significantly if used worldwide. Yet there are …

Metal organic vapour phase epitaxy of GaN and lateral overgrowth

P Gibart - Reports on Progress in Physics, 2004 - iopscience.iop.org
Gallium nitride (GaN) is an extremely promising wide band gap semiconductor material for
optoelectronics and high temperature, high power electronics. Actually, GaN is probably the …

Investigation of AlGaN/GaN high electron mobility transistor structures on 200-mm silicon (111) substrates employing different buffer layer configurations

HP Lee, J Perozek, LD Rosario, C Bayram - Scientific reports, 2016 - nature.com
AlGaN/GaN high electron mobility transistor (HEMT) structures are grown on 200-mm
diameter Si (111) substrates by using three different buffer layer configurations:(a) Thick …

Fast growth of strain-free AlN on graphene-buffered sapphire

Y Qi, Y Wang, Z Pang, Z Dou, T Wei… - Journal of the …, 2018 - ACS Publications
We study the roles of graphene acting as a buffer layer for growth of an AlN film on a
sapphire substrate. Graphene can reduce the density of AlN nuclei but increase the growth …

Three-dimensional imaging of threading dislocations in GaN crystals using two-photon excitation photoluminescence

T Tanikawa, K Ohnishi, M Kanoh, T Mukai… - Applied Physics …, 2018 - iopscience.iop.org
The three-dimensional imaging of threading dislocations in GaN films was demonstrated
using two-photon excitation photoluminescence. The threading dislocations were shown as …

Microwave performance of 'buffer-free'GaN-on-SiC high electron mobility transistors

DY Chen, A Malmros, M Thorsell… - IEEE Electron …, 2020 - ieeexplore.ieee.org
High performance microwave GaN-on-SiC HEMTs are demonstrated on a heterostructure
without a conventional thick doped buffer. The HEMT is fabricated on a high-quality 0.25 μm …

Threading dislocation reduction in (0 0 01) GaN thin films using SiNx interlayers

MJ Kappers, R Datta, RA Oliver, FDG Rayment… - Journal of Crystal …, 2007 - Elsevier
The ability of in situ SiNx interlayers to lower the density of threading dislocations (TDs) has
been studied for the growth of c-plane (0001) GaN epilayers on sapphire by organometallic …

Lattice parameters of AlN bulk, homoepitaxial and heteroepitaxial material

D Nilsson, E Janzén… - Journal of Physics D …, 2016 - iopscience.iop.org
Homoepitaxial layers of AlN and heteroepitaxial layers of AlN on 4H-SiC substrates were
grown by metalorganic chemical vapor deposition at high temperatures up to 1400 C, and …

Strain relaxation due to V-pit formation in InxGa1− xN∕ GaN epilayers grown on sapphire

TL Song - Journal of applied physics, 2005 - pubs.aip.org
Strain relaxation in semiconductor heterostructures generally occurs through the motion of
dislocations that generates misfit dislocations above a critical thickness. However, majority …