Crystal phase control of gold nanomaterials by wet-chemical synthesis

S Lu, J Liang, H Long, H Li, X Zhou, Z He… - Accounts of Chemical …, 2020 - ACS Publications
Conspectus Gold (Au), a transition metal with an atomic number of 79 in the periodic table of
elements, was discovered in approximately 3000 BC Due to the ultrahigh chemical stability …

Materials, processing and reliability of low temperature bonding in 3D chip stacking

L Zhang, Z Liu, SW Chen, Y Wang, WM Long… - Journal of Alloys and …, 2018 - Elsevier
Due to the advantages of small form factor, high performance, low power consumption, and
high density integration, three-dimensional integrated circuits (3D ICs) have been generally …

[HTML][HTML] Effect of Joule heating on the reliability of microbumps in 3D IC

Y Yao, Y An, J Dong, Y Wang, KN Tu, Y Liu - Journal of Materials Research …, 2024 - Elsevier
Due to the demand for high-performance electronic products, there has been a rapid
development in three-dimensional integrated circuit (3D IC) packaging technology. The 3D …

Study of electromigration in Sn-Ag-Cu micro solder joint with Ni interfacial layer

H Madanipour, YR Kim, CU Kim, D Mishra… - Journal of Alloys and …, 2021 - Elsevier
This paper reports the extreme sensitivity of the microstructure evolution in Sn-Ag-Cu (SAC)
micro-solder joint, consisting of 15–20 µm thick solder alloy and electrolytic Ni plated Cu …

Ni barrier symmetry effect on electromigration failure mechanism of Cu/Sn–Ag microbump

GT Park, BR Lee, K Son, YB Park - Electronic Materials Letters, 2019 - Springer
Ni barrier symmetry effect on the electromigration (EM) failure mechanism of Cu/Sn–Ag
microbump were systematically investigated by studying the intermetallic compound (IMC) …

Influence of Sn grain orientation on mean-time-to-failure equation for microbumps in 3D IC technology

Y Yao, AM Gusak, C Chen, Y Liu, KN Tu - Scripta Materialia, 2024 - Elsevier
The mean-time-to-failure (MTTF) associated with microbumps is a pivotal factor influencing
the reliability of cutting-edge consumer electronic devices. Within Sn-based solder joints, the …

Effect of Ni3Sn4 on the Thermo-Mechanical Fatigue Life of Solder Joints in 3D IC

L Zhang, SJ Zhong - Frontiers in Materials, 2021 - frontiersin.org
In this article, the 3D integration with Ni/Sn/Ni joints was conducted using transient liquid
phase (TLP) bonding (250° C, 0.2 N) with different bonding time. After TLP bonding, plane …

Improving thermal shock response of interfacial IMCs in Sn–Ag–Cu joints by using ultrathin-Ni/Pd/Au metallization in 3D-IC packages

TT Chou, CJ Fleshman, H Chen, JG Duh - Journal of Materials Science …, 2019 - Springer
The feasibility of novel ultrathin-Electroless Ni/Electroless Pd/Immersion Au (ultrathin-
ENEPIG) metallization containing ultrathin electroless Ni layer for 3D-IC packaging …

Solder volume effect on electromigration failure mechanism of Cu/Ni/Sn-Ag microbumps

YB Park, GT Park, BR Lee, JB Kim… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Effects of solder volume on the electromigration (EM) failure mechanism of Cu/Ni/Sn-2.5 Ag
microbumps were systematically investigated at 150° C with a current density of 1.5× 10 5 …

[HTML][HTML] Interface evolution and mechanical properties of Sn–36Pb–2Ag solder joints under different aging conditions

R Li, S Cong, J Mei, L Zhang, Z Chen, T Li… - Journal of Materials …, 2021 - Elsevier
Electronic packaging products are often subjected to reliability evaluation, Sn–Pb solder is
widely used in high-reliability military products due to its excellent soldering performance …