Wave diffraction by a rough boundary of an arbitrary plane-layered medium
IM Fuks - IEEE Transactions on Antennas and Propagation, 2001 - ieeexplore.ieee.org
The problem of electromagnetic (EM) wave scattering by a slightly rough boundary of an
arbitrary layered medium is solved by a small perturbation method. The bistatic amplitude of …
arbitrary layered medium is solved by a small perturbation method. The bistatic amplitude of …
Wave diffraction by rough interfaces in an arbitrary plane-layered medium
IM Fuks, AG Voronovich - Waves in Random Media, 2000 - iopscience.iop.org
The problem of electromagnetic wave scattering by a slightly rough interface in an arbitrarily
layered medium is solved by a small-perturbation method. The bistatic amplitude of …
layered medium is solved by a small-perturbation method. The bistatic amplitude of …
Ellipsometric parameters and reflectances of thin films with slightly rough boundaries
D Franta, I Ohlídal - Journal of Modern Optics, 1998 - Taylor & Francis
In this theoretical paper, formulae for important optical quantities of single layers with slightly
randomly rough boundaries are derived by means of a generalized Rayleigh–Rice theory …
randomly rough boundaries are derived by means of a generalized Rayleigh–Rice theory …
The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films
M Čermák, Š Kelarová, J Jurmanová, P Kührová… - Diamond and Related …, 2022 - Elsevier
Optical characterization from the FIR to the V-UV region of silicon and oxygen doped carbon
films deposited on a silicon substrates is performed. In this work, the deposited films are …
films deposited on a silicon substrates is performed. In this work, the deposited films are …
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
D Nečas, I Ohlídal, D Franta, M Ohlídal, V Čudek… - Applied …, 2014 - opg.optica.org
Epitaxial ZnSe thin films exhibiting two important defects, ie, boundary roughness and
thickness nonuniformity, prepared on GaAs substrates, are optically characterized using a …
thickness nonuniformity, prepared on GaAs substrates, are optically characterized using a …
Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh–Rice theory
J Vohánka, M Čermák, D Franta, I Ohlídal - Physica Scripta, 2019 - iopscience.iop.org
An efficient and numerically stable method for calculating the optical quantities of multi-layer
systems with slightly rough boundaries using the second order Rayleigh–Rice theory is …
systems with slightly rough boundaries using the second order Rayleigh–Rice theory is …
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
I Ohlídal, D Franta, D Nečas - Applied Surface Science, 2017 - Elsevier
In this paper epitaxial ZnSe thin films prepared by molecular beam epitaxy onto GaAs single
crystal substrates exhibiting two defects, ie boundary roughness and thickness non …
crystal substrates exhibiting two defects, ie boundary roughness and thickness non …
Improved combination of scalar diffraction theory and Rayleigh–Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces
I Ohlídal, D Franta, D Nečas - Thin Solid Films, 2014 - Elsevier
Expressions for ellipsometric quantities and reflectance presented are based on a heuristic
combination of the Rayleigh–Rice theory and the scalar diffraction theory. The latter takes …
combination of the Rayleigh–Rice theory and the scalar diffraction theory. The latter takes …
Determination of excitation profile and dielectric function spatial nonuniformity in porous silicon by using wkb approach
W He, IV Yurkevich, LT Canham, A Loni, A Kaplan - Optics express, 2014 - opg.optica.org
We develop an analytical model based on the WKB approach to evaluate the experimental
results of the femtosecond pump–probe measurements of the transmittance and reflectance …
results of the femtosecond pump–probe measurements of the transmittance and reflectance …
Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory
M Čermák, J Vohánka, I Ohlídal… - Journal of Modern …, 2018 - Taylor & Francis
In this paper, the exact approach of the Rayleigh–Rice theory enabling us to calculate
optical quantities of multi-layer systems with boundaries exhibiting slight random roughness …
optical quantities of multi-layer systems with boundaries exhibiting slight random roughness …