Reliability research on micro-and nano-electromechanical systems: a review

A Arab, Q Feng - The International Journal of Advanced Manufacturing …, 2014 - Springer
Research on micro/nano-electro-mechanical system (MEMS/NEMS) reliability is of crucial
importance, due to the fact that we are facing an era in which MEMS and emerging NEMS …

On the discharge transport mechanisms through the dielectric film in MEMS capacitive switches

D Birmpiliotis, G Stavrinidis… - Journal of …, 2020 - ieeexplore.ieee.org
A method that allows the investigation of discharge transport mechanism in dielectric films
used in MEMS capacitive switches or MIM capacitors or even bare dielectric films is …

K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability

A Persano, A Tazzoli, P Farinelli, G Meneghesso… - Microelectronics …, 2012 - Elsevier
Shunt capacitive RF MEMS switches were developed on GaAs substrate, using a III–V
technology process that is fully compatible with standard MMIC fabrication. The switches …

Boosting the electron beam transmittance of field emission cathode using a self-charging gate

D Xiao, H Du, L Sun, X Suo, Y Wang, Y Zhang… - Nature …, 2024 - nature.com
The gate-type carbon nanotubes cathodes exhibit advantages in long-term stable emission
owing to the uniformity of electrical field on the carbon nanotubes, but the gate inevitably …

On the injected charge distribution and discharge currents in the dielectric films for MEMS capacitive switches

G Papaioannou - Microelectronics Reliability, 2022 - Elsevier
The present work attempts to provide a different approach to understand the distribution of
injected charge in Si-rich SiN films that find application in MEMS capacitive switches. The …

Effect of humidity on the residual stress in silicon-containing plasma polymeric coatings

M Top, G Mulder, N Prager, J Fahlteich… - Surface and Coatings …, 2018 - Elsevier
Residual stress measurements of thin films are common practice in device technology and
are extremely important in particular for the characterization of thin film coatings. A largely …

Reducing interface traps with high density hydrogen treatment to increase passivated emitter rear contact cell efficiency

CC Yang, PH Chen, TC Chang, WC Su… - Nanoscale Research …, 2019 - Springer
In this work, a high-density hydrogen (HDH) treatment is proposed to reduce interface traps
and enhance the efficiency of the passivated emitter rear contact (PERC) device. The …

Electrical properties of nanostructured SiN films for MEMS capacitive switches

M Koutsoureli, S Xavier, L Michalas… - Journal of …, 2016 - iopscience.iop.org
The electrical properties of gold nanorods nanostructured silicon nitride films are
comprehensively investigated with the aid of metal–insulator–metal capacitors and RF …

Reaction-diffusion effects and spatiotemporal oscillations under SEM, STM and AFM-assisted charging in fiber-like and wire-like systems: From molecular and …

ED Adamovich, EL Buryanskaya… - Materials …, 2023 - ojs.acad-pub.com
This review addresses the problem of reaction-diffusion effects and spatiotemporal
oscillations in fiber-like and wire-like systems under the electron beam in SEM and in the …

Failure mechanisms and reliability analysis of RF MEMS switches

W Tian, Q Chao, Z Chen - Recent Patents on Mechanical …, 2015 - ingentaconnect.com
RF MEMS switches have attracted widespread attention in recent years. Compared to PIN
diodes and FET switches, RF MEMS switches have many advantages including low …