On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories
F Vargas, V Galstyan, G Harutyunyan… - 2024 IEEE 30th …, 2024 - ieeexplore.ieee.org
Aging of electronics can be caused by various physical mechanisms, including bias
temperature instability (BTI), hot carrier injection (HCI), time-dependent dielectric breakdown …
temperature instability (BTI), hot carrier injection (HCI), time-dependent dielectric breakdown …
Workload-aware static aging monitoring and mitigation of timing-critical flip-flops
In advanced technology nodes, bias temperature instability (BTI) has emerged as a
prominent reliability concern. The worst-case effects of BTI occur during specific workload …
prominent reliability concern. The worst-case effects of BTI occur during specific workload …
[PDF][PDF] Runtime Monitoring for Dependable Hardware Design
A Vijayan - 2019 - core.ac.uk
With technology scaling advancement and globalization of integrated circuit (IC)
manufacturing, a host of vulnerabilities affect dependability of computing hardware. Each …
manufacturing, a host of vulnerabilities affect dependability of computing hardware. Each …