Variation in performance and power across manufactured parts and their operating
conditions is an accepted reality in modern microelectronic manufacturing processes with …

This paper aims to take stock of recent advances in the field of energy-quality (EQ) scalable
circuits and systems, as promising direction to continue the historical exponential energy …

This paper presents an innovative and automated measurement setup for the
characterization of variability effects in CMOS transistors using array-based integrated …

In this paper we summarize recent results and contributions from the NSF Expedition on
Variability-Aware Software, a five year, multi-university effort to tackle the problem of …

In advanced technology nodes, large timing margins must be added to allow for worse
process, voltage, temperature, and aging variations. The error detection and correction …

Manufacturing and environmental variations cause timing errors that are typically avoided by
conservative design guardbands or corrected by circuit level error detection and correction …

As silicon integration technology pushes toward atomic dimensions, errors due to static and
dynamic variability are an increasing concern. To avoid such errors, designers often turn to" …

Scaling of semiconductor devices has enabled higher levels of integration and performance
improvements at the price of making devices more susceptible to the effects of static and …

Let us step back and first look at an ideal hardware where the entire software stack can be
executed. In reality, however, the hardware underneath of computing is being challenged as …

Various error models are being used in simulation of voltage-scaled arithmetic units to
examine application-level tolerance of timing violations. The selection of an error model …