Modeling static delay variations in push–pull CMOS digital logic circuits due to electrical disturbances in the power supply
Soft errors can occur in digital integrated circuits (ICs) as a result of an electromagnetic
disturbance, such as might result from an electrical fast transient (EFT). Many soft errors …
disturbance, such as might result from an electrical fast transient (EFT). Many soft errors …
Predicting statistical characteristics of jitter due to simultaneous switching noise
Switching of logic gates is often responsible for significant power supply noise. Predicting
the jitter resulting from the power supply noise can be critical to analyze the proper operation …
the jitter resulting from the power supply noise can be critical to analyze the proper operation …
Stochastic propagation delay through a cmos inverter as a consequence of stochastic power supply voltage—Part I: Model formulation
D Dietz - IEEE Transactions on Electromagnetic Compatibility, 2018 - ieeexplore.ieee.org
We derive analytically expressions for the probability distribution of the propagation delay
time of logic signals through a CMOS inverter when the inverter power supply voltage V dd …
time of logic signals through a CMOS inverter when the inverter power supply voltage V dd …
Stochastic propagation delay through a CMOS inverter as a consequence of stochastic power supply voltage—part II: modeling examples
D Dietz - IEEE Transactions on Electromagnetic Compatibility, 2018 - ieeexplore.ieee.org
We provide, in detail, three examples of the application of our stochastic model (a
companion paper in this journal) that provides analytical expressions for the probability …
companion paper in this journal) that provides analytical expressions for the probability …
Susceptibility of a microcontroller against electrical fast transients disturbances
J Nie, X Chen, W Shao, W Fang - Journal of Physics: Conference …, 2018 - iopscience.iop.org
This paper presents a research on the susceptibility of a microcontroller against electrical
fast transients (EFT) and the caused failure of the microcontroller. The susceptibility test …
fast transients (EFT) and the caused failure of the microcontroller. The susceptibility test …
A Kind of Stochastic Eigenvalue Complementarity Problems
Y Wang, S Du - Mathematical Problems in Engineering, 2018 - Wiley Online Library
With the development of computer science, computational electromagnetics have also been
widely used. Electromagnetic phenomena are closely related to eigenvalue problems. On …
widely used. Electromagnetic phenomena are closely related to eigenvalue problems. On …