VK Gupta, SR Agnew - International journal of fatigue, 2011 - Elsevier
SEM-based stereology in conjunction with electron backscattered diffraction established fatigue crack surface crystallography within the region from∼ 1 to 50μm of crack initiating …
It has been observed during fatigue cracking of AA 7075-T651 that a small percentage of Al 7 Cu 2 Fe particles crack during manufacturing or very early in their life. Some of the cracked …
SEM-based electron backscattered diffraction (EBSD) measurements characterize constituent-particle nucleated fatigue crack path relative to local grain orientation and crack …
VK Gupta, SR Agnew - Microscopy and Microanalysis, 2010 - cambridge.org
A simple algorithm is developed and implemented to eliminate ambiguities, in both statistical analyses of orientation data (eg, orientation averaging) and electron backscattered …
E Glaessgen, E Saether, S Smith… - 52nd AIAA/ASME …, 2011 - arc.aiaa.org
This paper describes a broad effort that is aimed at understanding the fundamental mechanisms of crack growth and using that understanding as a basis for designing …
The objective of this paper is to develop further a framework for computationally modeling microstructurally small fatigue crack growth in AA 7075-T651 [1]. The focus is on the …
EH Glaessgen, E Saether, SW Smith, JD Hochhalter… - researchgate.net
This paper describes a broad effort that is aimed at understanding the fundamental mechanisms of crack growth and using that understanding as a basis for designing …