Pseudorandom number generators (PRNGs) are important role in cryptography application.
Hardware based random number generators become faster. Field Programming Gate Arrays …

In high-speed Nano-scale VLSI designs, memory plays a vital role of operation. Built-In Self-
Test (BIST) for memory is an essential element of the system-on-chip (SoC). Investigating …

In the ongoing high-speed, high-tech sophistication in the technology of VLSI designs, Built-
in Self-Test (BIST) is emerging as the essential element of the memory, which can be treated …

This paper targets on the low power design of Memory Built In Self Test (MBIST) architecture
for System on Chip (SoC) based design. Proposed address generator is developed with the …

Recent strides in programmable logic density, speed and hardware description language
(HDL) have empowered the engineer with the ability to implement high-performance digital …

The authors consider the built-in self-test signature model. This article describes the analysis
shows the ability of signature schemes, as well as the synthesis of the test generator. The …

Power dissipation is a challenging problem in current VLSI designs. In general the power
consumption of device is more in the testing mode than in the normal system operation. Built …

With the increasing complexity and operation frequencies of Very Large Scale Integration
(VLSI) circuit designs, the power dissipation of VLSI circuits is rapidly increasing, causing …