Using transition fault test patterns for cost effective offline performance estimation
M Zandrahimi, P Debaud, A Castillejo… - … Conference on Design …, 2017 - ieeexplore.ieee.org
Process variation occurring during fabrication of complex VLSI devices induce uncertainties
in operation parameters (eg, supply voltage) to be applied to each device in order for it to fit …
in operation parameters (eg, supply voltage) to be applied to each device in order for it to fit …
Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS
M Zandrahimi, P Debaud, A Castillejo… - Journal of Electronic …, 2019 - Springer
With the continued down-scaling of IC technology and increase in manufacturing process
variations, it is becoming ever more difficult to accurately estimate circuit performance of …
variations, it is becoming ever more difficult to accurately estimate circuit performance of …