High spatial resolution mass spectrometry imaging for spatial metabolomics: Advances, challenges, and future perspectives

S Ma, Y Leng, X Li, Y Meng, Z Yin, W Hang - TrAC Trends in Analytical …, 2023 - Elsevier
Spatial metabolomics is an emerging field of omics research that has enabled localizing
small molecules in tissues and cells. Mass spectrometry imaging (MSI) technologies allow …

Metabolic imaging at the single-cell scale: recent advances in mass spectrometry imaging

IS Gilmore, S Heiles, CL Pieterse - Annual review of analytical …, 2019 - annualreviews.org
There is an increasing appreciation that every cell, even of the same type, is different. This
complexity, when additionally combined with the variety of different cell types in tissue, is …

The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

MK Passarelli, A Pirkl, R Moellers, D Grinfeld… - Nature …, 2017 - nature.com
We report the development of a 3D OrbiSIMS instrument for label-free biomedical imaging. It
combines the high spatial resolution of secondary ion mass spectrometry (SIMS; under 200 …

Molecular imaging and depth profiling by mass spectrometry—SIMS, MALDI or DESI?

JC Vickerman - Analyst, 2011 - pubs.rsc.org
The possibility of exploiting the analytical power of mass spectrometry to image the
chemistry of biological and similarly complex materials without the use of tags and with good …

[图书][B] Physical methods for materials characterisation

PEJ Flewitt, RK Wild - 2017 - taylorfrancis.com
This completely revised and expanded new edition covers the full range of techniques now
available for the investigation of materials structure and accurate quantitative determination …

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

S Rabbani, AM Barber, JS Fletcher… - Analytical …, 2011 - ACS Publications
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an established technique for
the characterization of solid sample surfaces. The introduction of polyatomic ion beams …

Universal equation for argon gas cluster sputtering yields

MP Seah - The Journal of Physical Chemistry C, 2013 - ACS Publications
An analysis is made of the sputtering yields of materials for argon gas cluster ion beams
used in SIMS and XPS as a function of the beam energy, E, and the cluster size, n. The …

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study

AG Shard, R Havelund, MP Seah, SJ Spencer… - Analytical …, 2012 - ACS Publications
The depth profiling of organic materials with argon cluster ion sputtering has recently
become widely available with several manufacturers of surface analytical instrumentation …

Gas cluster ion beams for secondary ion mass spectrometry

N Winograd - Annual review of analytical chemistry, 2018 - annualreviews.org
Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular
depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of …

Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging

S Yoon, TG Lee - Nano Convergence, 2018 - Springer
Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical
technique rapidly expanding in use in biological studies. This technique is based on high …