Reliability issues of thin film transistors subject to electrostatic discharge stresses: an overview
Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of
electronic components, which can result in a very high current passing through the device or …
electronic components, which can result in a very high current passing through the device or …
Electrical-performance and reliability improvement of flexible low-temperature polycrystalline silicon thin-film transistors via post-annealing process
H Im, JH Ahn, WY Kim, TE Ha, EK Jo… - Semiconductor …, 2022 - iopscience.iop.org
We investigated the improvement methods of the electrical characteristics and reliability of
flexible low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) by …
flexible low-temperature polycrystalline silicon (LTPS) thin-film transistors (TFTs) by …
Charging compensation layer on polyimide for enhanced device stability in flexible technology
H Kim, J Park, J Park, H Woo, J Lee, Y Park… - Electronic Materials …, 2021 - Springer
In this paper, we propose a structure that prevents the charging effects that occur in devices
fabricated on polyimide (PI) substrates. In general, when fabricating a device on a PI …
fabricated on polyimide (PI) substrates. In general, when fabricating a device on a PI …
Improvement of Strained Negative Bias Temperature Instability in Flexible LTPS TFTs by a Stress-Release Design
In this study, the negative bias temperature instability (NBTI) under mechanical strain
conditions of low-temperature polycrystalline silicon thin-film transistors (LTPS TFTs) with a …
conditions of low-temperature polycrystalline silicon thin-film transistors (LTPS TFTs) with a …
The Characteristics and Reliability With Channel Length Dependent on the Deposited Sequence of SiO2 and Si3N4 as PV in LTPS TFTs
CW Kuo, TM Tsai, TC Chang, HY Tu… - … on Device and …, 2024 - ieeexplore.ieee.org
This study investigates the characteristics on different channel lengths for a sequence of
Si3N4 and SiO2 deposition as PV of LTPS TFTs. After analyzing the subthreshold swing …
Si3N4 and SiO2 deposition as PV of LTPS TFTs. After analyzing the subthreshold swing …
P‐39: The New Method to Solve Low‐Gray Mura by Optimizing Oven Structure
S Ni, Z Lu, N Yuan, J Luo, Y Xie, Y Fu… - SID Symposium Digest …, 2023 - Wiley Online Library
With the development of advanced mobile phone, the demand of display quality is getting
higher and higher. As the key evaluation standard of display quality, low‐gray mura must be …
higher and higher. As the key evaluation standard of display quality, low‐gray mura must be …