[HTML][HTML] High-k/Ge MOSFETs for future nanoelectronics

Y Kamata - Materials today, 2008 - Elsevier
Recently developed high-permittivity (k) materials have reopened the door to Ge as a
channel material in metal-oxide-semiconductor field-effect transistors (MOSFETs). High-k/Ge …

[HTML][HTML] Diffusion of n-type dopants in germanium

A Chroneos, H Bracht - Applied Physics Reviews, 2014 - pubs.aip.org
Germanium is being actively considered by the semiconductor community as a mainstream
material for nanoelectronic applications. Germanium has advantageous materials …

Fermi-level pinning and charge neutrality level in germanium

A Dimoulas, P Tsipas, A Sotiropoulos… - Applied physics …, 2006 - pubs.aip.org
The Schottky barrier height in metal/Ge contacts shows weak dependence on the metal work
function indicating strong Fermi-level pinning close to the Bardeen limit. The pinning factor S …

Germanium MOSFET devices: Advances in materials understanding, process development, and electrical performance

DP Brunco, B De Jaeger, G Eneman… - Journal of The …, 2008 - iopscience.iop.org
Germanium possesses higher electron and hole mobilities than silicon. There is a big leap,
however, between these basic material parameters and implementation for high …

Ion beams in materials processing and analysis

B Schmidt, K Wetzig - 2012 - books.google.com
A comprehensive review of ion beam application in modern materials research is provided,
including the basics of ion beam physics and technology. The physics of ion-solid …

A significant shift of Schottky barrier heights at strongly pinned metal/germanium interface by inserting an ultra-thin insulating film

T Nishimura, K Kita, A Toriumi - Applied physics express, 2008 - iopscience.iop.org
At any metal/germanium (Ge) interfaces, Schottky junctions to n-Ge and ohmic ones to p-Ge
are formed by the strong Fermi level pinning to the valence band edge of Ge. In this paper …

Germanium channel MOSFETs: Opportunities and challenges

H Shang, MM Frank, EP Gusev, JO Chu… - IBM Journal of …, 2006 - ieeexplore.ieee.org
This paper reviews progress and current critical issues with respect to the integration of
germanium (Ge) surface-channel MOSFET devices as well as strained-Ge buried-channel …

Alleviation of Fermi-level pinning effect on metal/germanium interface by insertion of an ultrathin aluminum oxide

Y Zhou, M Ogawa, X Han, KL Wang - Applied Physics Letters, 2008 - pubs.aip.org
Due to the strong Fermi-level pinning close to the germanium (Ge) valence band edge, all
metal/p-type Ge contacts show Ohmic characteristics, while metal/n-type Ge contacts exhibit …

Germanium: From the first application of Czochralski crystal growth to large diameter dislocation-free wafers

B Depuydt, A Theuwis, I Romandic - Materials Science in Semiconductor …, 2006 - Elsevier
Being the pioneer material in the history of electronics, germanium has regained a lot of
interest as a semiconductor material for opto-electronic and electronic applications. We …

High performance germanium MOSFETs

K Saraswat, CO Chui, T Krishnamohan, D Kim… - Materials Science and …, 2006 - Elsevier
Ge is a very promising material as future channel materials for nanoscale MOSFETs due to
its high mobility and thus a higher source injection velocity, which translates into higher drive …