Development flow for on-line core self-test of automotive microcontrollers

P Bernardi, R Cantoro, S De Luca… - IEEE Transactions …, 2015 - ieeexplore.ieee.org
Software-Based Self-Test is an effective methodology for devising the online testing of
Systems-on-Chip. In the automotive field, a set of test programs to be run during mission …

Runtime software-based self-test with mutual inter-core checking

AS Terechko, GHO Daalderop, J van Doorn… - US Patent …, 2020 - Google Patents
(57) ABSTRACT A method, apparatus, article of manufacture, and system are provided for
detecting hardware faults on a multi-core integrated circuit device by executing runtime …

Next generation automotive architecture modeling and exploration for autonomous driving

B Zheng, H Liang, Q Zhu, H Yu… - 2016 IEEE computer …, 2016 - ieeexplore.ieee.org
To support emerging applications in autonomous and semi-autonomous driving, next-
generation automotive systems will be equipped with an increasing number of …

An effective functional safety solution for automotive systems-on-chip

G Tshagharyan, G Harutyunyan… - 2017 IEEE International …, 2017 - ieeexplore.ieee.org
An Effective Functional Safety Solution for Automotive Systems-on-Chip Page 1 Paper ET 2.2
INTERNATIONAL TEST CONFERENCE 1 978-1-5386-3413-4/17/$31.00 ©2017 IEEE Abstract …

Storage-based logic built-in self-test with partitioned deterministic compressed tests

I Pomeranz - IEEE Transactions on Very Large Scale …, 2023 - ieeexplore.ieee.org
Logic built-in self-test (LBIST) is important for in-field testing. In a storage-based LBIST
approach, deterministic test data are stored on-chip and used for applying tests that are …

Storage-based built-in self-test for gate-exhaustive faults

I Pomeranz - IEEE Transactions on Computer-Aided Design of …, 2020 - ieeexplore.ieee.org
Built-in self-test (BIST) approaches are suitable for in-field testing since they do not require a
tester for storage and application of test data. They also reduce the security vulnerabilities …

Zoom-in feature for storage-based logic built-in self-test

I Pomeranz - 2021 IEEE International Symposium on Defect …, 2021 - ieeexplore.ieee.org
Storage-based logic built-in self-test (LBI ST) does not require a tester, and enhances the
security of a chip. By storing deterministic test data on-chip, it allows a special type of …

Stress-Aware Periodic Test of Interconnects

S Sadeghi-Kohan, S Hellebrand… - Journal of Electronic …, 2021 - Springer
Safety-critical systems have to follow extremely high dependability requirements as
specified in the standards for automotive, air, and space applications. The required high fault …

A low-power BIST scheme using weight-aware scan grouping and scheduling for automotive ICs

K Lee, S Lee, J Park, I Lee, S Kang - IEEE Access, 2021 - ieeexplore.ieee.org
Scan-based logic built-in self-test (LBIST) is widely used for supporting the in-system test in
automotive systems. Although this technology has the advantage of low-cost testing, it …

Fault-independent test-generation for software-based self-testing

P Georgiou, X Kavousianos, R Cantoro… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field
testing of processor-based devices and systems-on-chips. Unfortunately, the stuck-at fault …