The conventional output compaction methods based on XOR-networks and/or linear
feedback shift registers may suffer from the problems of aliasing, unknown-values, and/or …

Conventional random access scan (RAS) for testing has lower test application time, low
power dissipation, and low test data volume compared to standard serial scan chain based …

Output selection is a recently proposed test response compaction method, where only a
subset of output response bits is selected for observation. It can achieve zero aliasing, full X …

Testing using a random access scan (RAS) design-for-test approach is experiencing
renewed interest because of the potential for lower test application time, low power …

This paper proposes a new single cycle access test structure for logic test. It eliminates the
peak power consumption problem of conventional shift-based scan chains and reduces the …

Modern IC design and manufacturing techniques are growing such that the transistor count
on a single chip escalates exponentially with complex Embedded and DSP cores in it …

Random Access Scan, which addresses individual flip-flops in a design using a memory
array like row and column decoder architecture, has recently attracted widespread attention …

Abstract Random Access Scan (RAS) as a design-for-test technique gained importance
recently with the ability to update each flip-flop independently. Thus, with this ability, the test …

In this paper we propose an output-bit selection technique for test response compaction,
with which only a subset of output response bits is selected for observation during testing …

A Power Optimization Technique for VLSI circuit were proposed. It eliminates the peak
power consumption problem of conventional shift-based scan chains and reduces the …