Testing of Neighborhood Pattern-Sensitive Faults for Memory
KLV Ramana Kumari, M Asha Rani, N Balaji - Soft Computing and Signal …, 2022 - Springer
The important fundamental integrated circuits (ICs) in system ICs and electronic systems are
semiconductor memories. With the increase in technology, the density, capacity of memory …
semiconductor memories. With the increase in technology, the density, capacity of memory …
Novel test methods for NPSF faults in SRAM
M Parvathi, T Himasree… - … on Computational and …, 2018 - ieeexplore.ieee.org
NPSF (Neighborhood Pattern Sensitive Faults) involves with three or more cells in the
memory. These NPSF fault models are recognized as high quality fault models for memory …
memory. These NPSF fault models are recognized as high quality fault models for memory …
Random Testing of 3-cell NPSF in memories using LFSR and NLFSR.
This paper proposes a new check analysis method for testing of NPSF defects in wide range
access memories. LFSR and NLFSR's are used as address generators to select a particular …
access memories. LFSR and NLFSR's are used as address generators to select a particular …