A T-shaped SOI tunneling field-effect transistor with novel operation modes

C Liu, Q Ren, Z Chen, L Zhao, C Liu… - IEEE Journal of the …, 2019 - ieeexplore.ieee.org
We present a novel T-shaped tunneling field-effect transistor (TFET) on Si-on-insulator (SOI).
The asymmetric source-drain structure can effectively suppress the ambipolar switching. The …

Sub-1 ns characterization methodology for transistor electrical parameter extraction

Y Qu, B Chen, W Liu, J Han, J Lu, Y Zhao - Microelectronics Reliability, 2018 - Elsevier
In this paper, a novel method is proposed for the extraction of the transistor electrical
parameters at the nanosecond timescale. This technique is enabled by an ultra-fast …

A simple and universal measurement method for the efficiency of pulsed RF power amplifiers

WR Fang, WH Huang, WH Huang, C Fu… - IEEE …, 2020 - ieeexplore.ieee.org
This paper presents a simple and universal measurement method for the average efficiency
and instantaneous efficiency of pulsed RF power amplifiers. The average efficiency of the …

Ultrafast IDVG Technique for Reliable Cryogenic Device Characterization

PR Shrestha, A Akturk, B Hoskins… - IEEE Journal of the …, 2023 - ieeexplore.ieee.org
An in-depth understanding of the transient operation of devices at cryogenic temperatures
remains experimentally elusive. However, the impact of these transients has recently …

Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) Pulsed Current-Voltage Characterization Technique: Design and Discussion

DE Messaoud, B Djezzar, M Boubaaya… - Instruments and …, 2023 - Springer
In this paper, we implement the pulsed current–voltage (PIV) technique for the metal-oxide-
semiconductor field-effect transistor (MOSFET) device's ultrafast characterization based on …

[引用][C] Si/SiGe-based gate-normal tunneling field-effect transistors

S Glaß - 2019 - Dissertation, RWTH Aachen …