Recent progress in metal-organic chemical vapor deposition of N-polar group-III nitrides

S Keller, H Li, M Laurent, Y Hu, N Pfaff… - Semiconductor …, 2014 - iopscience.iop.org
Progress in metal-organic chemical vapor deposition of high quality $\left (000\bar {1}\right)
$ N-polar (Al, Ga, In) N films on sapphire, silicon carbide and silicon substrates is reviewed …

GaN-based power devices: Physics, reliability, and perspectives

M Meneghini, C De Santi, I Abid, M Buffolo… - Journal of Applied …, 2021 - pubs.aip.org
Over the last decade, gallium nitride (GaN) has emerged as an excellent material for the
fabrication of power devices. Among the semiconductors for which power devices are …

Polarity in GaN and ZnO: Theory, measurement, growth, and devices

J Zuniga-Perez, V Consonni, L Lymperakis… - Applied Physics …, 2016 - pubs.aip.org
The polar nature of the wurtzite crystalline structure of GaN and ZnO results in the existence
of a spontaneous electric polarization within these materials and their associated alloys (Ga …

Record-low thermal boundary resistance between diamond and GaN-on-SiC for enabling radiofrequency device cooling

M Malakoutian, DE Field, NJ Hines… - … Applied Materials & …, 2021 - ACS Publications
The implementation of 5G-and-beyond networks requires faster, high-performance, and
power-efficient semiconductor devices, which are only possible with materials that can …

Demonstration of constant 8 W/mm power density at 10, 30, and 94 GHz in state-of-the-art millimeter-wave N-polar GaN MISHEMTs

B Romanczyk, S Wienecke, M Guidry… - … on Electron Devices, 2017 - ieeexplore.ieee.org
This paper reports on state-of-the-art millimeter-wave power performance of N-polar GaN-
based metal–insulator–semiconductor high-electron-mobility transistors at 30 and 94 GHz …

N-polar ScAlN and HEMTs grown by molecular beam epitaxy

P Wang, D Wang, B Wang, S Mohanty, S Diez… - Applied Physics …, 2021 - pubs.aip.org
Molecular beam epitaxy of single-phase wurtzite N-polar Sc x Al 1− x N (x∼ 0.11–0.38) has
been demonstrated on sapphire substrates by locking its lattice-polarity to the underlying N …

6.2 W/Mm and record 33.8% PAE at 94 GHz from N-polar GaN deep recess MIS-HEMTs with ALD Ru gates

W Liu, B Romanczyk, M Guidry, N Hatui… - IEEE Microwave and …, 2021 - ieeexplore.ieee.org
This letter reports on the W-band power performance of N-polar GaN deep recess MIS-high
electron mobility transistors (HEMTs) using a new atomic layer deposition (ALD) ruthenium …

High-electron-mobility GaN grown on free-standing GaN templates by ammonia-based molecular beam epitaxy

ECH Kyle, SW Kaun, PG Burke, F Wu, YR Wu… - Journal of applied …, 2014 - pubs.aip.org
The dependence of electron mobility on growth conditions and threading dislocation density
(TDD) was studied for n−-GaN layers grown by ammonia-based molecular beam epitaxy …

N-polar GaN cap MISHEMT with record power density exceeding 6.5 W/mm at 94 GHz

S Wienecke, B Romanczyk, M Guidry… - IEEE Electron …, 2017 - ieeexplore.ieee.org
A novel N-Polar GaN cap (MIS) high electron mobility transistor demonstrating record 6.7-
W/mm power density with an associated power-added efficiency of 14.4% at 94 GHz is …

N-polar GaN: Epitaxy, properties, and device applications

S Mohanty, K Khan, E Ahmadi - Progress in Quantum Electronics, 2023 - Elsevier
Abstract In recent years, Gallium Nitride (GaN) has been established as a material of choice
for high power switching, high power RF and lighting applications. In c-direction, depending …