Silica on silicon carbide

V Presser, KG Nickel - Critical reviews in solid state and materials …, 2008 - Taylor & Francis
Silicon carbide (SiC) as both the most important non-oxide ceramic and promising
semiconductor material grows stoichiometric SiO 2 as its native oxide. During passive …

Carrier lifetime and breakdown phenomena in SiC power device material

T Kimoto, H Niwa, T Okuda, E Saito… - Journal of Physics D …, 2018 - iopscience.iop.org
Recent progress and current understanding of carrier lifetimes and avalanche phenomena
in silicon carbide (SiC) are reviewed. The acceptor level of carbon vacancy (VC), called the …

Efficient ab initio method for the calculation of frequency-dependent second-order optical response in semiconductors

SN Rashkeev, WRL Lambrecht, B Segall - Physical Review B, 1998 - APS
The development of a method for calculating the frequency-dependent second harmonic
generation coefficient of insulators and semiconductors based on the self-consistent …

[图书][B] Silicon carbide: recent major advances

WJ Choyke, H Matsunami, G Pensl - 2003 - books.google.com
Since the 1997 publication of" Silicon Carbide-A Review of Fundamental Questions and
Applications to Current Device Technology" edited by Choyke, et al., there has been …

SiC materials-progress, status, and potential roadblocks

AR Powell, LB Rowland - Proceedings of the IEEE, 2002 - ieeexplore.ieee.org
SiC materials are currently metamorphosing from research and development into a market
driven manufacturing product. SiC substrates are currently used as the base for a large …

Anisotropic thermal conductivity of 4H and 6H silicon carbide measured using time-domain thermoreflectance

X Qian, P Jiang, R Yang - Materials Today Physics, 2017 - Elsevier
Silicon carbide (SiC) is a wide bandgap (WBG) semiconductor with promising applications
in high-power and high-frequency electronics. Among its many useful properties, the high …

Properties of hexagonal polytypes of group-IV elements from first-principles calculations

C Raffy, J Furthmüller, F Bechstedt - Physical Review B, 2002 - APS
Results of ab initio calculations are reported for hexagonal polytypes of C, Si, and Ge in
equilibrium and under hydrostatic pressure. For each polytype 2 H, 3 C, 4 H, and 6 H, the …

SiC semiconductor devices technology, modeling and simulation

T Ayalew - 2004 - repositum.tuwien.at
WIDE BANDGAP semiconductor, particularly Silicon Carbide (SiC), based electronic
devices and circuits are presently being developed for use in high-temperature, high-power …

Spontaneous formation of stacking faults in highly doped 4H–SiC during annealing

TA Kuhr, JQ Liu, HJ Chung, M Skowronski… - Journal of applied …, 2002 - pubs.aip.org
4H–SiC samples doped with nitrogen at∼ 3× 10 19 cm− 3 were annealed in Ar for 90 min at
1150° C. Transmission electron microscopy revealed stacking faults at a density of …

Thermal Expansion of 3C-SiC Obtained from In-Situ X-ray Diffraction at High Temperature and First-Principal Calculations

NM Sultan, TMB Albarody, HKM Al-Jothery… - Materials, 2022 - mdpi.com
In situ X-ray crystallography powder diffraction studies on beta silicon carbide (3C-SiC) in
the temperature range 25–800° C at the maximum peak (111) are reported. At 25° C, it was …