T Kimoto, H Niwa, T Okuda, E Saito… - Journal of Physics D …, 2018 - iopscience.iop.org
Recent progress and current understanding of carrier lifetimes and avalanche phenomena in silicon carbide (SiC) are reviewed. The acceptor level of carbon vacancy (VC), called the …
The development of a method for calculating the frequency-dependent second harmonic generation coefficient of insulators and semiconductors based on the self-consistent …
WJ Choyke, H Matsunami, G Pensl - 2003 - books.google.com
Since the 1997 publication of" Silicon Carbide-A Review of Fundamental Questions and Applications to Current Device Technology" edited by Choyke, et al., there has been …
SiC materials are currently metamorphosing from research and development into a market driven manufacturing product. SiC substrates are currently used as the base for a large …
Silicon carbide (SiC) is a wide bandgap (WBG) semiconductor with promising applications in high-power and high-frequency electronics. Among its many useful properties, the high …
Results of ab initio calculations are reported for hexagonal polytypes of C, Si, and Ge in equilibrium and under hydrostatic pressure. For each polytype 2 H, 3 C, 4 H, and 6 H, the …
WIDE BANDGAP semiconductor, particularly Silicon Carbide (SiC), based electronic devices and circuits are presently being developed for use in high-temperature, high-power …
TA Kuhr, JQ Liu, HJ Chung, M Skowronski… - Journal of applied …, 2002 - pubs.aip.org
4H–SiC samples doped with nitrogen at∼ 3× 10 19 cm− 3 were annealed in Ar for 90 min at 1150° C. Transmission electron microscopy revealed stacking faults at a density of …
In situ X-ray crystallography powder diffraction studies on beta silicon carbide (3C-SiC) in the temperature range 25–800° C at the maximum peak (111) are reported. At 25° C, it was …