The reliability of MEMS in shock environments is a complex area which involves structural dynamics, fracture mechanics, and system reliability theory etc. With growth in the use of …
Tribochemical wear of contact materials is an important issue in science and engineering. Understanding the mechanisms of tribochemical wear at an atomic scale is favorable to …
D Capriglione, M Carratù, M Catelani… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
The use of microelectro-mechanical systems (MEMS)-based inertial measurement units (IMUs) is widespread in many applications concerning monitoring, diagnostic, and/or …
S Zheng, SX Mao - Extreme Mechanics Letters, 2021 - Elsevier
With the ongoing trend of miniaturizing electronic devices, the dimensions of metallic materials used in these devices decrease continuously from sub-microns to a few …
SY Tsai, YA Chen, JD You, JP Chu, P Yiu - Surface and Coatings …, 2023 - Elsevier
In this study, we fabricated high entropy alloy (HEA) thin films by RF magnetron co- sputtering of Inconel 718 and Ti-6Al-4V targets. Their coefficient of friction (CoF) and specific …
V Pachkawade - IEEE Sensors Journal, 2024 - ieeexplore.ieee.org
This article covers rigorous overview of diverse transduction principles that have enabled successful development of micro/nanoelectromechanical systems (MEMS/NEMS) devices …
P Rafiee, G Khatibi, M Zehetbauer - Microelectronics International, 2017 - emerald.com
Purpose The purpose of this paper is to provide an overview of the major reliability issues of microelectromechanical systems (MEMS) under mechanical and environmental loading …
Tooth surfaces of silicon-based MEMS microgears are described as smooth surfaces covered by adhesive asperities (nanoblocks). To reduce adhesive effects, the tooth surfaces …
A Arab, Q Feng - The International Journal of Advanced Manufacturing …, 2014 - Springer
Research on micro/nano-electro-mechanical system (MEMS/NEMS) reliability is of crucial importance, due to the fact that we are facing an era in which MEMS and emerging NEMS …