It has been proposed that miniature circuitry will ultimately be crafted from single atoms.
Despite many advances in the study of atoms and molecules on surfaces using scanning …

We report the mechanically induced formation of a silicon–hydrogen covalent bond and its
application in engineering nanoelectronic devices. We show that using the tip of a …

Using a noncontact atomic force microscope, we track and manipulate the position of single
electrons confined to atomic structures engineered from silicon dangling bonds on the …

The combination of scanning tunnelling microscopy (STM) and non-contact atomic force
microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily …

A clean tungsten (W) tip apex with a robust atomic plane is required for producing a stable
tunneling electron emission under strong electric fields. Because a tip apex fabricated from a …

The origin of bond-resolved atomic force microscope images remains controversial.
Moreover, most work to date has involved planar, conjugated hydrocarbon molecules on a …

Using a non-contact atomic force microscope (nc-AFM), we examine continuous dangling
bond (DB) wire structures patterned on the hydrogen terminated silicon (100)-2× 1 surface …

As self-sensing and self-exciting probes, quartz sensors present many advantages over
silicon cantilevers for microscopy, micro-robotics, and other micro-applications. Their …

Atomically sharp tips are a requirement for scanning-probe microscopy, such as scanning
tunneling microscopy (STM) and atomic force microscopy (AFM). Compared with STM, AFM …

Atomic force microscopy (AFM) is used to investigate surface structures by measuring the
interaction force between the tip and sample. Non-contact AFM (NC-AFM) that incorporates …