ZEC ECC: A Zero-byte Eliminating Compression Based ECC Scheme for DRAM Reliability

JH Kwon, HK Bae, YS Lee, YH Gong… - IEEE Access, 2024 - ieeexplore.ieee.org
As DRAM cells continue to shrink, the conventional single error correction and double error
detection (SECDED) code is not sufficient to provide DRAM error resilience. To satisfy …

Memory Controller with Adaptive ECC for Reliable System Operation

M Stefani, C Marcon, F Silva… - 2023 36th SBC/SBMicro …, 2023 - ieeexplore.ieee.org
Memory errors can cause crashes and data loss, which are unacceptable for various
computing systems, mainly large servers. Memory controllers can mitigate these errors by …

A Proposal of an ECC-based Adaptive Fault-Tolerant Mechanism for 16-bit data words

J Gracia-Morán, LJ Saiz-Adalid… - IEEE Latin America …, 2024 - ieeexplore.ieee.org
With the integration scale level reached in CMOS technology, memory systems provide a
great storage capacity, but at the price of an augment in their fault rate. In this way, the …

Sparrow ECC: A Lightweight ECC Approach for HBM Refresh Reduction towards Energy-efficient DNN Inference

H Kim, SH Choi, J Kong, YH Gong… - Proceedings of the 29th …, 2024 - dl.acm.org
Exponential growth in deep neural network (DNN) model size has resulted in significant
demands for memory bandwidth, leading to the extensive adoption of high bandwidth …

Improving DRAM Reliability Using a High Order Error Correction Code

W Li, M Zhang, T Gui, Z Fang, C Xie… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Dynamic random access memory (DRAM) is being upgraded iteratively, and as a result, its
transmission rate and bandwidth are rising quickly. Simultaneously, as the DRAM process …

Hybrid Hardware/Software Detection of Multi-Bit Upsets in Memory

R Thunig, C Borchert, U Kober… - 2024 54th Annual IEEE …, 2024 - ieeexplore.ieee.org
Bit flips in main memory can be caused by a multitude of environmental effects, such as heat
or radiation, as well as by malicious actors exploiting Rowhammer-style hardware …

Twin ECC: A Data Duplication Based ECC for Strong DRAM Error Resilience

HK Bae, MJ Chung, YH Gong… - … Design, Automation & …, 2023 - ieeexplore.ieee.org
With the continuous scaling of process technology, DRAM reliability has become a critical
challenge in modern memory systems. Currently, DRAM memory systems for servers …

[PDF][PDF] Dynamic fault tolerant mechanism for memory controllers

MP Stefani - 2023 - repositorio.pucrs.br
Erros de memória podem causar falhas, vulnerabilidades de segurança, corrupção e perda
de dados que são inaceitáveis para servidores. Esses problemas impulsionam a construção …