Molecular imaging and depth profiling by mass spectrometry—SIMS, MALDI or DESI?

JC Vickerman - Analyst, 2011 - pubs.rsc.org
The possibility of exploiting the analytical power of mass spectrometry to image the
chemistry of biological and similarly complex materials without the use of tags and with good …

Secondary ion mass spectrometry: characterizing complex samples in two and three dimensions

JS Fletcher, JC Vickerman - Analytical chemistry, 2013 - ACS Publications
Over the last 10 or so years, developments in molecular se-condary ion mass spectrometry
(SIMS) have taken its capability into areas previously only demonstrated in dynamic SIMS …

Computational view of surface based organic mass spectrometry

BJ Garrison, Z Postawa - Mass Spectrometry Reviews, 2008 - Wiley Online Library
Surface based mass spectrometric approaches fill an important niche in the mass analysis
portfolio of tools. The particular niche depends on both the underlying physics and chemistry …

A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems

JS Fletcher, JC Vickerman - Analytical and bioanalytical chemistry, 2010 - Springer
With the implementation of focused primary ion beams, secondary ion mass spectrometry
(SIMS) has become a significant technique in the rapidly emerging field of mass spectral …

SIMS—A precursor and partner to contemporary mass spectrometry

JC Vickerman, N Winograd - International Journal of Mass Spectrometry, 2015 - Elsevier
Significant events driving the development of SIMS over the last 50 years are reviewed. The
discussion includes recollections of dynamic and static SIMS from the 1970s, of the …

Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry

AM Piwowar, JS Fletcher, J Kordys… - Analytical …, 2010 - ACS Publications
Although the benefits of decreased sample temperature for the molecular profiling of organic
materials with time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been …

Direct analysis of ion-induced peptide fragmentation in secondary-ion mass spectrometry

P Schneider, F Verloh, A Portz, S Aoyagi… - Analytical …, 2020 - ACS Publications
Primary-ion-induced fragmentation in organic molecules can strongly influence the results in
secondary-ion mass spectrometry (SIMS) of organic and biomolecular samples. In order to …

Internal Energy of Molecules Ejected Due to Energetic C60 Bombardment

BJ Garrison, Z Postawa, KE Ryan… - Analytical …, 2009 - ACS Publications
The early stages of C60 bombardment of octane and octatetraene crystals are modeled
using molecular dynamics simulations with incident energies of 5− 20 keV. Using the …

Computer Simulations of the Sputtering of Metallic, Organic, and Metal–Organic Surfaces with Bin and C60 Projectiles

A Delcorte, C Leblanc, C Poleunis… - The Journal of Physical …, 2013 - ACS Publications
This study focuses on the microscopic modeling of 0–25 keV Bi1–3–5 and C60 cluster
impacts on three different targets (Au crystal, adsorbed Au nanoparticle, and organic solid) …

Gallium-induced milling of silicon: A computational investigation of focused ion beams

MF Russo, M Maazouz, LA Giannuzzi… - Microscopy and …, 2008 - academic.oup.com
Molecular dynamics simulations are performed to model milling via a focused ion beam
(FIB). The goal of this investigation is to examine the fundamental dynamics associated with …