Denoising particle beam micrographs with plug-and-play methods
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a
sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed …
sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed …
Online beam current estimation in particle beam microscopy
In conventional particle beam microscopy, knowledge of the beam current is essential for
accurate micrograph formation and sample milling. This generally necessitates offline …
accurate micrograph formation and sample milling. This generally necessitates offline …
Continuous-time modeling and analysis of particle beam metrology
Particle beam microscopy (PBM) performs nanoscale imaging by pixelwise capture of scalar
values representing noisy measurements of the response from secondary electrons (SEs) …
values representing noisy measurements of the response from secondary electrons (SEs) …
Addressing neon gas field ion source instability through online beam current estimation
Focused ion beam microscopes require stable beam current for accurate micrograph
formation and sample milling. In practice, the beam current emitted by a gas field ion source …
formation and sample milling. In practice, the beam current emitted by a gas field ion source …