In this paper, we surveyed the recent advancements in DDYA, which includes scan-based
diagnosis technologies and diagnosis driven yields analysis. Multiple industrial cases …

A production worthy methodology has been outlined that uses layout aware scan diagnosis
data to validate whether certain topologies are design-process induced defects. The …

Diagnosis memory footprint for large designs is growing as design sizes grow such that the
diagnosis throughput for given computational resources becomes a bottleneck in volume …

The semiconductor industry ramping up design capabilities for emerging technologies is
facing unprecedented test quality and yield management challenges. To facilitate diagnosis …

To find out the root causes of yield loss is always expensive and time-consuming. In this
paper, we have developed an in-house flow of volume diagnosis. With the power of …

On-chip instrumentation is mandatory for efficient bring-up, test and diagnosis, post-silicon
validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable …

Aspects of the invention relate to yield analysis techniques for generating root cause
candidates for yield analysis. With various implementations of the invention, points of …

The semiconductor industry ramping up design capabilities for emerging technologies is
facing new test quality and yield management challenges. To facilitate debugging of the first …

This work presents our improvement of the failure localization techniques of logic circuits
using voltage contrast (VC) in yield enhancement. VC analysis is known as a useful …

Scan logic diagnosis turns failing test cycles into valuable data and is an established
method for digital semiconductor defect localization. The advent of layout-aware scan …