The demand for richer multimedia services, multifunctional portable devices and high data
rates can only been visioned due to the improvement in semiconductor technology …

Integration of RF circuits in deeply scaled CMOS technologies and severe process variation
in those technology nodes result in poor manufacturing yield. A post-manufacture tuning …

The study of multiple classifier systems has become an area of intensive research in pattern
recognition recently. Also in handwriting recognition, systems combining several classifiers …

This work presents a new approach for controlling power consumption in RF devices. The
approach is based on the definition of application-dependent performance modes for power …

In this research, a new post-manufacture tuning approach for yield improvement of
advanced RF systems is developed. The proposed method first determines module level …

This paper proposes a new multi-channel testing architecture for high-speed eye-diagram.
The proposed architecture reconstructs the eye-diagram of a multi-Gbps bit pattern with the …

In this paper, a novel built-in tuning technique to compensate for process variability-induced
imperfections in RF circuits is proposed. The yield improvement methodology proposed is a …

This paper proposes a new method to reconstruct signal by a monobit receiver based on
incoherent subsampling. The proposed method uses a time-variant threshold voltage for the …

This paper presents a methodology for post-manufacture tuning of MIMO (Multiple-Input-
Multiple-Output) wireless systems aimed at increasing device manufacturing yield under …

Les technologies microélectroniques ainsi que les outils de CAO actuels permettent la
conception de plus en plus rapide de circuits et systèmes intégrés très complexes. L'un des …