GaN on Si technologies for power switching devices

M Ishida, T Ueda, T Tanaka… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
This paper reviews the recent activities for normally-off GaN-based gate injection transistors
(GITs) on Si substrates and their application to inverters. Epitaxial growth of the AlGaN/GaN …

III–nitrides: Growth, characterization, and properties

SC Jain, M Willander, J Narayan… - Journal of Applied …, 2000 - pubs.aip.org
During the last few years the developments in the field of III–nitrides have been spectacular.
High quality epitaxial layers can now be grown by MOVPE. Recently good quality epilayers …

Substrates for gallium nitride epitaxy

L Liu, JH Edgar - Materials Science and Engineering: R: Reports, 2002 - Elsevier
In this review, the structural, mechanical, thermal, and chemical properties of substrates
used for gallium nitride (GaN) epitaxy are compiled, and the properties of GaN films …

[HTML][HTML] 633-nm InGaN-based red LEDs grown on thick underlying GaN layers with reduced in-plane residual stress

D Iida, Z Zhuang, P Kirilenko, M Velazquez-Rizo… - Applied Physics …, 2020 - pubs.aip.org
This work investigates the influence of residual stress on the performance of InGaN-based
red light-emitting diodes (LEDs) by changing the thickness of the underlying n-GaN layers …

Strain-related phenomena in GaN thin films

C Kisielowski, J Krüger, S Ruvimov, T Suski, JW Ager III… - Physical review B, 1996 - APS
Abstract Photoluminescence (PL), Raman spectroscopy, and x-ray diffraction are employed
to demonstrate the co-existence of a biaxial and a hydrostatic strain that can be present in …

[PDF][PDF] Thick GaN epitaxial growth with low dislocation density by hydride vapor phase epitaxy

A Usui, H Sunakawa, A Sakai… - … JOURNAL OF APPLIED …, 1997 - researchgate.net
1. Introduction Recently, blue-or ultraviolet-light-emitting lasers have been developed using
GaN and InGaN-based compound semiconductors.*** These device structures have been …

Recent progress in red light-emitting diodes by III-nitride materials

D Iida, K Ohkawa - Semiconductor Science and Technology, 2021 - iopscience.iop.org
GaN-based light-emitting devices have the potential to realize all visible emissions with the
same material system. These emitters are expected to be next-generation red, green, and …

Lattice parameters of gallium nitride

M Leszczynski, H Teisseyre, T Suski, I Grzegory… - Applied Physics …, 1996 - pubs.aip.org
Lattice parameters of gallium nitride were measured using high-resolution x-ray diffraction.
The following samples were examined:(i) single crystals grown at pressure of about 15 …

Growth defects in GaN films on sapphire: The probable origin of threading dislocations

XJ Ning, FR Chien, P Pirouz, JW Yang… - Journal of materials …, 1996 - cambridge.org
Single crystal GaN films with a wurtzite structure were grown on the basal plane of sapphire.
A high density of threading dislocations parallel to the c-axis crossed the film from the …

Thermal stress in GaN epitaxial layers grown on sapphire substrates

T Kozawa, T Kachi, H Kano, H Nagase… - Journal of applied …, 1995 - pubs.aip.org
Thermal stress in GaN epitaxial layers with different thicknesses grown on sapphire
substrates by metalorganic vapor phase epitaxy using an AlN buffer layer was investigated …