GaAs epitaxy on Si substrates: modern status of research and engineering

YB Bolkhovityanov, OP Pchelyakov - Physics-Uspekhi, 2008 - iopscience.iop.org
While silicon and gallium arsenide are dominant materials in modern micro-and
nanoelectronics, devices fabricated from them still use Si and GaAs substrates only …

Ge dots and nanostructures grown epitaxially on Si

JM Baribeau, X Wu, NL Rowell… - Journal of Physics …, 2006 - iopscience.iop.org
We review recent progress in the growth and characterization of Si 1− x Ge x islands and Ge
dots on (001) Si. We discuss the evolution of the island morphology with Si 1− x Ge x …

Self-aligned wrapped-around structure

JP Colinge, KC Ching, TP Guo, CH Diaz - US Patent 9,209,247, 2015 - Google Patents
An embodiment vertical wrapped-around structure and method of making. An embodiment
method of making a self-aligned vertical structure-all-around device including forming a …

Kinetic wrinkling of an elastic film on a viscoelastic substrate

R Huang - Journal of the Mechanics and Physics of Solids, 2005 - Elsevier
A compressed elastic film on a compliant substrate can form wrinkles. On an elastic
substrate, equilibrium and energetics set the critical condition and select the wrinkle …

Evolution of wrinkles in hard films on soft substrates

Z Huang, W Hong, Z Suo - Physical Review E—Statistical, Nonlinear, and Soft …, 2004 - APS
A compressively strained film on a substrate can wrinkle into intricate patterns. This Rapid
Communication studies the evolution of the wrinkle patterns. The film is modeled as an …

Strain scaling for CMOS

SW Bedell, A Khakifirooz, DK Sadana - Mrs Bulletin, 2014 - cambridge.org
This article describes various techniques for applying strain to current and future
complementary metal–oxide–semiconductor (CMOS) channels to boost CMOS …

Mechanism of wrinkle formation in curing coatings

SK Basu, LE Scriven, LF Francis… - Progress in Organic …, 2005 - Elsevier
Five wrinkling coating systems–ranging from liquid-applied, thermally cured acrylic-
melamine and alkyd systems to powder-applied, thermally cured epoxy and polyester …

Fully-depleted strained-Si on insulator NMOSFETs without relaxed SiGe buffers

H Yin, KD Hobart, RL Peterson, FJ Kub… - IEEE International …, 2003 - ieeexplore.ieee.org
Fully-depleted strained Si n-channel MOSFETs were demonstrated on a compliant
borophosphorosilicate insulator (BPSG) without an underlying SiGe buffer layer. Stress …

Эпитаксия GaAs на кремниевых подложках: современное состояние исследований и разработок

ЮБ Болховитянов, ОП Пчеляков - Успехи физических наук, 2008 - ufn.ru
Кремний является основным материалом электроники. Около 95% всех
полупроводниковых приборов производится с использованием кремниевых подложек …

Method for inducing strain in vertical semiconductor columns

JP Colinge, GS Chang, CH Diaz - US Patent 9,368,619, 2016 - Google Patents
Abstract A vertical Metal-Oxide-Semiconductor (MOS) transistor includes a substrate and a
nano-wire over the substrate. The nano-wire comprises a semiconductor material. An oxide …