Information limit of 15 picometers achieved with bright-field ptychography
It is generally assumed that a high spatial resolution of a microscope requires a large
numerical aperture of the imaging lens or detector. In this study, the information limit of 15 …
numerical aperture of the imaging lens or detector. In this study, the information limit of 15 …
Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detector
Optimum bright-field scanning transmission electron microscopy (OBF STEM) is a recently
developed low-dose imaging technique that uses a segmented or pixelated detector. While …
developed low-dose imaging technique that uses a segmented or pixelated detector. While …
Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
Robust atomic resolution structural characterization of point defects in 3D is a longstanding
challenge for electron microscopy. Here, we evaluate multislice electron ptychography as a …
challenge for electron microscopy. Here, we evaluate multislice electron ptychography as a …