[HTML][HTML] A design concept for radiation hardened RADFET readout system for space applications

M Andjelkovic, A Simevski, J Chen, O Schrape… - Microprocessors and …, 2022 - Elsevier
Instruments for measuring the absorbed dose and dose rate under radiation exposure,
known as radiation dosi-meters, are indispensable in space missions. They are composed …

Chip temperature optimization for dark silicon many-core systems

M Li, W Liu, L Yang, P Chen… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
In the dark silicon era, a fundamental problem is given a real-time computation demand,
how to determine if an on-chip multiprocessor system is able to accept this demand and to …

Erpot: A quad-criteria scheduling heuristic to optimize execution time, reliability, power consumption and temperature in multicores

A Girault, HR Zarandi - IEEE Transactions on Parallel and …, 2019 - ieeexplore.ieee.org
We investigate multi-criteria optimization and Pareto front generation. Given an application
modeled as a Directed Acyclic Graph (DAG) of tasks and a multicore architecture, we …

Energy-efficient application mapping and scheduling for lifetime guaranteed MPSoCs

W Liu, J Yi, M Li, P Chen, L Yang - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Energy optimization is one of the most critical objectives for the synthesis of multiprocessor
system-on-chip (MPSoC). Besides, to ensure a long processor lifetime and to maintain a …

Synergistic effect of BTI and process variations on the soft error rate estimation in digital circuits

L Li, L Xiao, H Liu, Z Mao - IEEE Access, 2022 - ieeexplore.ieee.org
Soft errors, aging effects and process variations have become the three most critical
reliability issues for nanoscale complementary metal oxide semiconductor (CMOS) circuits …

Characterization and modeling of Single Event Transient propagation through standard combinational cells

M Andjelkovic, M Krstic - Microelectronics Reliability, 2023 - Elsevier
Abstract Analysis of Single Event Transient (SET) effects is an important step in the design of
radiation-hardened integrated circuits for space missions. Because the simulation of SET …

A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells

M Andjelkovic - 2021 - publishup.uni-potsdam.de
With the downscaling of CMOS technologies, the radiation-induced Single Event Transient
(SET) effects in combinational logic have become a critical reliability issue for modern …

Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors

M Andjelkovic, M Marjanovic, B Drasko… - Journal of Circuits …, 2022 - World Scientific
Single Event Transients (SETs), ie, voltage glitches induced in combinational logic as a
result of the passage of energetic particles, represent an increasingly critical reliability threat …

Cross-Layer Digital Design Flow for Space Applications

M Krstic, M Andjelkovic, O Schrape… - 2021 IEEE 32nd …, 2021 - ieeexplore.ieee.org
Reliability and fault tolerance needs in space applications pose additional requirements to
the chip design flow. In order to successfully cope with space related issues, cross-layer …

Resiliency in Digital Processing Systems

M Krstić, M Andjelković, J Chen, L Lu… - 2023 IEEE 33rd …, 2023 - ieeexplore.ieee.org
Reliability in integrated circuits (ICs) has been an important topic for many years. Numerous
methods for achieving reliability in ICs have been proposed. Nevertheless, the traditional …