Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

JE Sader, JA Sanelli, BD Adamson, JP Monty… - Review of Scientific …, 2012 - pubs.aip.org
for a rectangular cantilever requires measurement of the resonant frequency and quality
factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically …

Validity and accuracy of resonance shift prediction formulas for microcantilevers: a review and comparative study

MA Mahmoud - Critical Reviews in Solid State and Materials …, 2016 - Taylor & Francis
This article provides a review of methods of predicting mass-induced resonance shifts in
microcantilevers. It combines a review of factors that influence resonance frequency shifts …

Deciphering the scaling of single-molecule interactions using Jarzynski's equality

S Raman, T Utzig, T Baimpos, B Ratna Shrestha… - Nature …, 2014 - nature.com
Unravelling the complexity of the macroscopic world relies on understanding the scaling of
single-molecule interactions towards integral macroscopic interactions. Here, we …

Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers

AD Slattery, AJ Blanch, JS Quinton, CT Gibson - Nanotechnology, 2012 - iopscience.iop.org
Static methods to determine the spring constant of AFM cantilevers have been widely used
in the scientific community since the importance of such calibration techniques was …

Nanostructural and nanomechanical alterations of photosensitized lipid membranes due to light induced formation of reactive oxygen species

Á Zolcsák, B Kiss, T Bozó, J Somkuti, I Vona… - Scientific Reports, 2025 - nature.com
Photosensitization has a wide range of applications in vastly distant fields. Three key
components must be present at the same time to trigger the related photodynamic effect …

Atomic force microscope cantilever calibration using a focused ion beam

AD Slattery, JS Quinton, CT Gibson - Nanotechnology, 2012 - iopscience.iop.org
A calibration method is presented for determining the spring constant of atomic force
microscope (AFM) cantilevers, which is a modification of the established Cleveland added …

Spring constant calibration techniques for next-generation fast-scanning atomic force microscope cantilevers

AD Slattery, AJ Blanch, V Ejov, JS Quinton… - …, 2014 - iopscience.iop.org
As a recent technological development, high-speed atomic force microscopy (AFM) has
provided unprecedented insights into dynamic processes on the nanoscale, and is capable …

Direct thermal noise calibration of colloidal probe cantilevers

LO Heim, TS Rodrigues, E Bonaccurso - Colloids and Surfaces A …, 2014 - Elsevier
We show that the spring constant of colloidal probes made by attaching spherical
microparticles to atomic force microscope cantilevers can be directly calibrated by the …

Thickness‐Dependent Relative Dielectric Constant of Organic Ultrathin Films

C Summonte, F Borgatti, C Albonetti - ChemPhysChem, 2024 - Wiley Online Library
In formulas employed for analysis of organic electronic devices, the relative dielectric
constant value of the semiconductor organic films is often assumed rather than measured …

A unique self-sensing, self-actuating AFM probe at higher eigenmodes

Z Wu, T Guo, R Tao, L Liu, J Chen, X Fu, X Hu - Sensors, 2015 - mdpi.com
With its unique structure, the Akiyama probe is a type of tuning fork atomic force microscope
probe. The long, soft cantilever makes it possible to measure soft samples in tapping mode …