Six cases of reliability study of Pb-free solder joints in electronic packaging technology

K Zeng, KN Tu - Materials science and engineering: R: reports, 2002 - Elsevier
Solder is widely used to connect chips to their packaging substrates in flip chip technology
as well as in surface mount technology. At present, the electronic packaging industry is …

Tin–lead (SnPb) solder reaction in flip chip technology

KN Tu, K Zeng - Materials science and engineering: R: reports, 2001 - Elsevier
Solder reactions between SnPb and one of the four metals, Cu, Ni, Au, and Pd have been
reviewed on the basis of the available data of morphology, thermodynamics, and kinetics …

A high-capacity Sn metal anode for aqueous acidic batteries

H Zhang, D Xu, F Yang, J Xie, Q Liu, DJ Liu, M Zhang… - Joule, 2023 - cell.com
Aqueous acidic batteries are a good choice to respond to battery diversity, delivering safety,
cost, environmental friendliness, and high-power necessary for renewable energy storage …

Experimental and thermodynamic assessment of Sn-Ag-Cu solder alloys

KW Moon, WJ Boettinger, UR Kattner… - Journal of electronic …, 2000 - Springer
Sn-rich alloys in the Sn-Ag-Cu system are being studied for their potential as Pb-free
solders. Thus, the location of the ternary eutectic involving L,(Sn), Ag 3 Sn and Cu 6 Sn 5 …

Nucleation of intragranular ferrite at Ti2O3 particle in low carbon steel

JH Shim, YW Cho, SH Chung, JD Shim, DN Lee - Acta Materialia, 1999 - Elsevier
Systematic experiments have been performed to study the intragranular nucleation
phenomena of ferrite in Ti-bearing low carbon steels. The fine intragranular acicular ferrite …

Morphology, kinetics, and thermodynamics of solid-state aging of eutectic SnPb and Pb-free solders (Sn–3.5 Ag, Sn–3.8 Ag–0.7 Cu and Sn–0.7 Cu) on Cu

TY Lee, WJ Choi, KN Tu, JW Jang, SM Kuo… - Journal of Materials …, 2002 - cambridge.org
Intermetallic compound (IMC) growth during solid-state aging at 125, 150, and 170° C up to
1500 h for four solder alloys (eutectic SnPb, Sn–3.5 Ag, Sn–3.8 Ag–0.7 Cu, and Sn–0.7 Cu) …

Diffusion parameters and growth mechanism of phases in the Cu-Sn system

A Paul, C Ghosh, WJ Boettinger - Metallurgical and materials transactions …, 2011 - Springer
The tracer diffusion coefficients of the elements as well as the integrated interdiffusion
coefficients are determined for the Cu 3 Sn and Cu 6 Sn 5 intermetallic compounds using …

Growth kinetics of Cu6Sn5 intermetallic compound at liquid-solid interfaces in Cu/Sn/Cu interconnects under temperature gradient

N Zhao, Y Zhong, ML Huang, HT Ma, W Dong - Scientific reports, 2015 - nature.com
The growth behavior of intermetallic compounds (IMCs) at the liquid-solid interfaces in
Cu/Sn/Cu interconnects during reflow at 250° C and 280° C on a hot plate was investigated …

Assessment techniques, database design and software facilities for thermodynamics and diffusion

R Schmid-Fetzer, D Andersson, PY Chevalier, L Eleno… - Calphad, 2007 - Elsevier
The purpose of this article is to give a set of recommendations to producers of assessed
thermodynamic data, who may be involved in either the critical evaluation of limited …

Extremely rapid grain growth in scallop-type Cu6Sn5 during solid–liquid interdiffusion reactions in micro-bump solder joints

AM Gusak, KN Tu, C Chen - Scripta Materialia, 2020 - Elsevier
In 3D IC technology, when the size of the micro-bump solder joint is reduced to 10 µm, the
scallop-type Cu 6 Sn 5 grains on opposite sides of the joint can interact directly by …