[图书][B] Computer science handbook
AB Tucker - 2004 - taylorfrancis.com
When you think about how far and fast computer science has progressed in recent years, it's
not hard to conclude that a seven-year old handbook may fall a little short of the kind of …
not hard to conclude that a seven-year old handbook may fall a little short of the kind of …
Metastability of CMOS latch/flip-flop
LS Kim, RW Dutton - IEEE Journal of solid-state circuits, 1990 - ieeexplore.ieee.org
Optimal device size, aspect ratio, and configurations for the design of the metastable
hardened CMOS latch/flip-flops are obtained by using the AC small-signal analysis in the …
hardened CMOS latch/flip-flops are obtained by using the AC small-signal analysis in the …
Error probability in synchronous digital circuits due to power supply noise
F Martorell, M Pons, A Rubio… - … Conference on Design & …, 2007 - ieeexplore.ieee.org
This paper presents a probabilistic approach to model the problem of power supply voltage
fluctuations. Error probability calculations are shown for some 90-nm technology digital …
fluctuations. Error probability calculations are shown for some 90-nm technology digital …
Power supply noise and logic error probability
D Andrade, F Martorell, M Pons, F Moll… - 2007 18th European …, 2007 - ieeexplore.ieee.org
Voltage fluctuations caused by parasitic impedances in the power supply rails of modern ICs
are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse …
are a major concern in nowadays ICs. The voltage fluctuations are spread out to the diverse …
Comparing causes of system failure
EJ McCluskey - Microprocessing and Microprogramming, 1986 - Elsevier
Abstract System failure has many different causes. This presentation identifies and illustrates
these causes. An attempt is made to assess their relative importance. Major topics …
these causes. An attempt is made to assess their relative importance. Major topics …
[图书][B] Electrical, thermal, and architecture aspects of VLSI packaging and interconnects for high-speed digital computers
WE Pence IV - 1989 - search.proquest.com
Packaging and interconnects for Very Large Scale Integration (VLSI) integrated circuits have
become problematic as chip power levels, Input/Output (I/O) counts, and signal speeds have …
become problematic as chip power levels, Input/Output (I/O) counts, and signal speeds have …
Fault models
S Mourad, EJ McCluskey - Testing and Diagnosis of VLSI and ULSI, 1988 - Springer
1. INTRODUCI10N A key requirement for obtaining reliable electronic systems is the ability
to control the effects of failures in such systems. Failures in integrated circuits can be …
to control the effects of failures in such systems. Failures in integrated circuits can be …
Reliable Digital Systems and Related Stanford University Research
EJ McCluskey - The Evolution of Fault-Tolerant Computing: In the …, 1987 - Springer
The various types of digital system applications as they relate to the required reliability
characteristics are surveyed. High quality, cost-effective repair is identified as the most …
characteristics are surveyed. High quality, cost-effective repair is identified as the most …
Fault Modeling
SK Tewksbury, SK Tewksbury - Wafer-Level Integrated Systems …, 1989 - Springer
Fault Modeling Page 1 Chapter 6 Fault Modeling 6.1 General Fault Modeling Issues The
objective of fault modeling is to evaluate the various errors which can occur in digital circuits as …
objective of fault modeling is to evaluate the various errors which can occur in digital circuits as …
Memory Constituent Subcircuits
TP Haraszti - Cmos Memory Circuits, 2002 - Springer
Subcircuits of memories, apart from the memory cells and sense amplifiers, are similar to
those component circuits which are used in traditional digital and analog circuits. State-of …
those component circuits which are used in traditional digital and analog circuits. State-of …