Process control in micro-embossing: a review

DE Hardt, B Ganesan, W Qi, M Dirckx, AK Rzepniewski - 2004 - dspace.mit.edu
A promising technique for the large-scale manufacture of micro-fluidic devices and photonic
devices is hot embossing of polymers such as PMMA. Micro-embossing is a deformation …

Programmable thermal processing module for semiconductor substrates

K El-Awady, CD Schaper… - IEEE transactions on …, 2004 - ieeexplore.ieee.org
This paper proposes the use of multivariable control methods to design a thermal platform
for processing semiconductor substrates (semiconductor wafers and/or quartz reticles for …

Parameter optimization of sub-35 nm contact-hole fabrication using particle swarm optimization approach

TS Li, CM Hsu - Expert Systems with Applications, 2010 - Elsevier
The major research focus on integrated circuits (ICs) mainly deals with increasing circuit
performance and functional complexity of circuit. The lithography process is the most critical …

An In Situ Approach to Real-Time Spatial Control of Steady-State Wafer Temperature During Thermal Processing in Microlithography

A Tay, WK Ho, N Hu - IEEE transactions on semiconductor …, 2007 - ieeexplore.ieee.org
We proposed an in situ method to control the steady-state wafer temperature uniformity
during thermal processing in microlithography. Thermal processing of wafer in the …

Control of photoresist film thickness: Iterative feedback tuning approach

A Tay, WK Ho, J Deng, BK Lok - Computers & chemical engineering, 2006 - Elsevier
The microlithography process is the most critical step in the fabrication of nanostructures for
integrated circuit manufacturing. The most important variable in the microlithography …

Equipment design and control of advanced thermal-processing module in lithography

A Tay, HT Chua, Y Wang… - IEEE Transactions on …, 2009 - ieeexplore.ieee.org
A programmable multizone thermal-processing module is developed to achieve wafer-
temperature uniformity during the thermal-cycling process in lithography. The bake and chill …

In situ fault detection of wafer warpage in microlithography

WK Ho, A Tay, Y Zhou, K Yang - IEEE transactions on …, 2004 - ieeexplore.ieee.org
Wafer warpage is common in microelectronics processing. Warped wafers can affect device
performance, reliability and linewidth control in various processing steps. We proposed in …

Nonlinear modeling and multivariable control of photolithography

S Lachman-Shalem, B Grosman… - IEEE Transactions on …, 2002 - ieeexplore.ieee.org
This paper describes a novel approach for the control of the entire photolithography track
using a combination of two methods: genetic programming (GP) and nonlinear model …

On control of resist film uniformity in the microlithography process

WK Ho, A Tay, LL Lee, CD Schaper - Control engineering practice, 2004 - Elsevier
A novel approach to improve photoresist thickness uniformity after the conventional spin-
coating and softbake process is proposed in this paper. Using an array of thickness sensors …

Constraint feedforward control for thermal processing of quartz photomasks in microelectronics manufacturing

A Tay, WK Ho, CD Schaper, LL Lee - Journal of Process Control, 2004 - Elsevier
A feedforward control scheme is designed to improve performance of conductive heating
systems used for lithography in microelectronics processing. It minimizes the loading effects …