In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

All material bodies are surrounded by a fluctuating electromagnetic field because of the
thermal and quantum fluctuations of the current density inside them. Close to the surface of …

Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Mapping energy transformation pathways and dissipation on the nanoscale and
understanding the role of local structure in dissipative behavior is a key challenge for …

A 290-nm-thick single-crystal silicon cantilever has been cooled in vacuum to a temperature
of 110 mK in order reduce its thermal motion and thereby improve the achievable force …

Noncontact friction between a Au (111) surface and an ultrasensitive gold-coated cantilever
was measured as a function of tip-sample spacing, temperature, and bias voltage using …

In the three decades since scanning probe microscopy (SPM) methods have entered the
scientific arena, they have become one of the main tools of nanoscale science and …

Atomically resolved dynamic force microscopy (DFM) images of step and kink sites of NaCl
films grown on the Cu (111) surface are presented. Combining experimental results with an …

Single-electron charging in an individual InAs quantum dot was observed by electrostatic
force measurements with an atomic-force microscope (AFM). The resonant frequency shift …

Experimental aspects of measuring dissipation on atomic scale using large-amplitude
dynamic force microscopy are discussed. Dissipation versus distance curves reveal that …