Preparation and Characterization of NbxOy Thin Films: A Review

NC Emeka, PE Imoisili, TC Jen - Coatings, 2020 - mdpi.com
Niobium oxides (NbO, NbO2, Nb2O5), being a versatile material has achieved tremendous
popularity to be used in a number of applications because of its outstanding electrical …

Atomic layer deposition of groups 4 and 5 transition metal oxide thin films: focus on heteroleptic precursors

T Blanquart, J Niinistö, M Ritala… - Chemical Vapor …, 2014 - Wiley Online Library
The atomic layer deposition (ALD) process, an alternative to CVD, is universally appreciated
for its unique advantages such as excellent repeatability, conformity, and thickness control at …

Challenges of Ta2O5 as high-k dielectric for nanoscale DRAMs

E Atanassova, A Paskaleva - Microelectronics Reliability, 2007 - Elsevier
The present status, successes, challenges and future of Ta2O5, and mixed Ta2O5-based
high-k layers as active component in storage capacitors of nanoscale DRAMs are …

Evaluation and Comparison of Novel Precursors for Atomic Layer Deposition of Nb2O5 Thin Films

T Blanquart, J Niinisto, M Heikkila… - Chemistry of …, 2012 - ACS Publications
Atomic layer deposition (ALD) of Nb2O5 thin films was studied using three novel precursors,
namely, tBuN Nb (NEt2) 3, tBuN Nb (NMeEt) 3, and tamylN Nb (OtBu) 3. These …

A new precursor route for the growth of NbO2 thin films by chemical vapor deposition

R Singh, P Chithaiah, CNR Rao - Nanotechnology, 2023 - iopscience.iop.org
Niobium dioxide (NbO 2) exhibits metal-insulator transition (Mott transition) and shows the
potential for application in memristors and neuromorphic devices. Presently growth of NbO 2 …

Effect of isovalent substitution on microstructure and phase transition of LaNb1− xMxO4 (M= Sb, V or Ta; x= 0.05–0.3)

S Wachowski, A Mielewczyk-Gryn, M Gazda - Journal of Solid State …, 2014 - Elsevier
LaNb 1− x M x O 4 oxides with pentavalent elements of different ionic sizes (M= Sb, Ta and
V, x= 0.05–0.3) were synthesized by the solid state reaction method. Special interest was …

[HTML][HTML] Synthesis of novel volatile niobium precursors containing carboxamide for Nb2O5 thin films

JM Hwang, NY Kim, S Shin, JH Lee, JY Ryu, T Eom… - Polyhedron, 2021 - Elsevier
A series of novel Nb (V) t Bu-imido/N-alkoxy carboxamide complexes, NbCl 2 (N t
Bu)(pyridine)(edpa)(1), NbCl 2 (N t Bu)(pyridine)(mdpa)(2), and Nb (N t Bu)(mdpa) 3 (3) …

Dielectric properties and X-ray photoelectron spectroscopic studies of niobium oxide thin films prepared by direct liquid injection chemical vapor deposition method

DC Bharti, SW Rhee - Thin Solid Films, 2013 - Elsevier
Niobium oxide thin films were grown by direct liquid injection chemical vapor deposition
using Nb (OC 2 H 5) 5 precursor. Influence of reactant's molar ratios [oxygen: Nb (OC 2 H 5) …

Improving the dielectric constant of Al2O3 by cerium substitution for high-k MIM applications

R Sohal, G Lupina, O Seifarth, P Zaumseil, C Walczyk… - Surface science, 2010 - Elsevier
Process compatible high-k dielectric thin films are one of the key solutions to develop high
performance metal–insulator–metal (MIM) structures for future microelectronic devices …

High-performance imido–amido precursor for the atomic layer deposition of Ta2O5

T Blanquart, V Longo, J Niinistö… - Semiconductor …, 2012 - iopscience.iop.org
The atomic layer deposition of Ta 2 O 5 thin films was studied using a novel imido–amido
precursor t BuN= Ta (NEt 2) 3. This precursor is liquid at room temperature, possesses good …