Fine-grained aging-induced delay prediction based on the monitoring of run-time stress
Run-time solutions based on online monitoring and adaptation are required for resilience in
nanoscale integrated circuits, as design-time solutions and guard bands are no longer …
nanoscale integrated circuits, as design-time solutions and guard bands are no longer …
Contemporary CMOS aging mitigation techniques: Survey, taxonomy, and methods
The proposed paper addresses the overarching reliability issue of transistor aging in
nanometer-scaled circuits. Specifically, a comprehensive survey and taxonomy of …
nanometer-scaled circuits. Specifically, a comprehensive survey and taxonomy of …
Lifetime improvement by exploiting aggressive voltage scaling during runtime of error-resilient applications
In this paper, we present an accuracy-aware operating voltage management unit to improve
the lifetime of processors by considering the error-resilient nature of some applications. This …
the lifetime of processors by considering the error-resilient nature of some applications. This …
NBTI and HCI aging prediction and reliability screening during production test
L Yu, J Ren, X Lu, X Wang - IEEE Transactions on Computer …, 2019 - ieeexplore.ieee.org
With the semiconductor manufacturing technology approaching to 14 nm and below, the
reliability of IC is challenged, as the speed of CMOS or FinFET is degraded by the aging …
reliability of IC is challenged, as the speed of CMOS or FinFET is degraded by the aging …
Device aging: A reliability and security concern
Device aging is an important concern in nanoscale designs. Due to aging the electrical
behavior of transistors embedded in an integrated circuit deviates from original intended …
behavior of transistors embedded in an integrated circuit deviates from original intended …
LSTM-based analysis of temporally-and spatially-correlated signatures for intermittent fault detection
Intermittent faults are a critical reliability threat in deep submicron VLSI circuits. These faults
occur non-deterministically due to unstable hardware and unpredictable operating …
occur non-deterministically due to unstable hardware and unpredictable operating …
Prognosis of NBTI aging using a machine learning scheme
Circuit aging is an important failure mechanism in nanoscale designs and is a growing
concern for the reliability of future systems. Aging results in circuit performance degradation …
concern for the reliability of future systems. Aging results in circuit performance degradation …
Workload-aware worst path analysis of processor-scale NBTI degradation
As technology further scales semiconductor devices, aging-induced device degradation has
become one of the major threats to device reliability. In addition, aging mechanisms like the …
become one of the major threats to device reliability. In addition, aging mechanisms like the …
A survey of aging monitors and reconfiguration techniques
LR Juracy, MT Moreira, AM Amory… - arXiv preprint arXiv …, 2020 - arxiv.org
CMOS technology scaling makes aging effects an important concern for the design and
fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit …
fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit …
Instruction-level NBTI stress estimation and its application in runtime aging prediction for embedded processors
I Moghaddasi, A Fouman, ME Salehi… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Lifetime reliability management of miniaturized CMOS devices continuously gets more
importance with the shrinking of technology size. Neither of existing design-time solutions …
importance with the shrinking of technology size. Neither of existing design-time solutions …