Reliable systems on unreliable fabrics
The continued scaling of silicon fabrication technology has led to significant reliability
concerns, which are quickly becoming a dominant design challenge. Design integrity is …
concerns, which are quickly becoming a dominant design challenge. Design integrity is …
Parameter variation tolerance and error resiliency: New design paradigm for the nanoscale era
Variations in process parameters affect the operation of integrated circuits (ICs) and pose a
significant threat to the continued scaling of transistor dimensions. Such parameter …
significant threat to the continued scaling of transistor dimensions. Such parameter …
Leakage power and circuit aging cooptimization by gate replacement techniques
As technology scales, the aging effect caused by negative bias temperature instability (NBTI)
has become a major reliability concern. In the mean time, reducing leakage power remains …
has become a major reliability concern. In the mean time, reducing leakage power remains …
On the efficacy of input vector control to mitigate NBTI effects and leakage power
As technology scales, the aging effect caused by Negative Bias Temperature Instability
(NBTI) has become a major reliability concerns for circuit designers. Consequently, we have …
(NBTI) has become a major reliability concerns for circuit designers. Consequently, we have …
Thermal-aware reliability analysis for platform FPGAs
Increasing levels of integration in Field Programmable Gate Arrays, have resulted in high on-
chip power densities, and temperatures. The heterogeneity of components and scaled …
chip power densities, and temperatures. The heterogeneity of components and scaled …
Comparative analysis of NBTI effects on low power and high performance flip-flops
K Ramakrishnan, X Wu… - … on Computer Design, 2008 - ieeexplore.ieee.org
Mitigating the circuit aging effect in digital circuits has become a very important concern for
current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of …
current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of …
Node criticality computation for circuit timing analysis and optimization under NBTI effect
W Wang, S Yang, Y Cao - 9th International Symposium on …, 2008 - ieeexplore.ieee.org
For sub-65 nm technology nodes, Negative Bias Temperature Instability (NBTI) has become
a primary limiting factor of circuit lifetime. During the past few years, researchers have spent …
a primary limiting factor of circuit lifetime. During the past few years, researchers have spent …
BTI-Gater: An aging-resilient clock gating methodology
Negative-and positive bias temperature instability (N/PBTI) have become one of the most
important reliability issues in modern semiconductor technology. N/PBTI-induced …
important reliability issues in modern semiconductor technology. N/PBTI-induced …
MOSFET Modeling for 45nm and Beyond
Y Cao, C McAndrew - 2007 IEEE/ACM International …, 2007 - ieeexplore.ieee.org
Compact MOSFET models are a critical link between technology and design. The inexorable
reduction in supply voltage and geometry to 45nm and below adds or emphasizes physical …
reduction in supply voltage and geometry to 45nm and below adds or emphasizes physical …
A framework for estimating NBTI degradation of microarchitectural components
M DeBole, K Ramakrishnan… - 2009 Asia and South …, 2009 - ieeexplore.ieee.org
Degradation of device parameters over the lifetime of a system is emerging as a significant
threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of …
threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of …