Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis...

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[HTML][HTML] Crystal plasticity modeling of deformation behavior of Al–Al2Cu eutectics based on high-fidelity representative microstructures

M Jiang, Y Chen, Z Yang, X Hu, L Zhang, J Li… - Journal of Materials …, 2024 - Elsevier
A comprehensive understanding of material deformation behavior holds importance in
enhancing the properties of materials, which can be achieved through modeling the …
被引用次数：3 相关文章 所有 3 个版本

Thickness-dependent growth of Ni vertical columns deposited by GLAD method: Study on the microstructural and optical properties

J Potočnik, M Novaković, M Popović - Optical Materials, 2024 - Elsevier
The paper presents a study on the structural and optical properties of nickel (Ni) thin films in
the shape of vertical columns obtained by using the glancing angle deposition method. The …
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[引用][C] Introduction to the Special Collection for the Society of Vacuum Coaters' 66th Annual Technical Conference

JW Pinder, J Crossman, B Kulbacki… - Surface and Coatings …, 2024 - Elsevier
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