Optical Response Near the Soft X‐Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X‐Ray Resonant Reflectivity
M Nayak, GS Lodha - Journal of Atomic and Molecular Physics, 2011 - Wiley Online Library
Fine structure features of energy‐dependent atomic scattering factor near the atomic
absorption edge, are used for structural analysis of low‐Z containing thin film structures. The …
absorption edge, are used for structural analysis of low‐Z containing thin film structures. The …
Effect of UHV annealing on morphology and roughness of sputtered Si (1 1 1)-(7× 7) surfaces
Ar+ ion has been used regularly for the cleaning of semiconductor, metal surfaces for
epitaxial nanostructures growth. We have investigated the effect of low-energy Ar+ ion …
epitaxial nanostructures growth. We have investigated the effect of low-energy Ar+ ion …
Probing Atomic Migration in Nanostructured Multilayers:<? format?> Application of X-Ray Standing Wave Fields
X-ray standing wave fields, excited in periodic nanostructured multilayers during Bragg
diffraction, have been used to probe atomic migration in multilayers. Ion beam induced …
diffraction, have been used to probe atomic migration in multilayers. Ion beam induced …
Effect of UHV annealing on morphology and roughness of sputtered surfaces
$ Ar^+ $ ion has been used regularly for the cleaning of semiconductor, metal surfaces for
epitaxial nanostructures growth. We have investigated the effect of low-energy $ Ar^+ $ ion …
epitaxial nanostructures growth. We have investigated the effect of low-energy $ Ar^+ $ ion …
Asymmetric transient enhanced intermixing in Pt/Ti
The ion-sputtering induced intermixing is studied by Monte Carlo transport of ions in matter
(TRIM), molecular-dynamics (MD) simulations, and Auger electron spectroscopy depth …
(TRIM), molecular-dynamics (MD) simulations, and Auger electron spectroscopy depth …
Ion-beam induced transformations in nanoscale multilayers: Evolution of clusters with preferred length scales
Ion-irradiation-induced modifications of a periodic Pt∕ C multilayer system containing a
small amount of Fe have been analyzed by transmission electron microscopy and grazing …
small amount of Fe have been analyzed by transmission electron microscopy and grazing …
Fluence dependent oscillatory amorphization and recrystallization in ion irradiation
Ion-beam-induced amorphization and recrystallization are well-known phenomena. At a
constant ion flux, there is a substrate temperature TR such that, for T< TR the irradiation …
constant ion flux, there is a substrate temperature TR such that, for T< TR the irradiation …
Investigations of elemental depth distribution and chemical compositions in the TiO2/SiO2/Si structures after ion irradiation
TV Phuc, M Kulik, D Kołodyńska, LH Khiem… - Surface and Coatings …, 2020 - Elsevier
The influence of noble gases ion implantation on the depth distribution of elements in the
TiO 2/SiO 2 bilayers on the Si substrates has been investigated using the Rutherford …
TiO 2/SiO 2 bilayers on the Si substrates has been investigated using the Rutherford …
Nonmagnetic to magnetic nanostructures via ion irradiation
A Pt/C multilayer stack (15 layer-pairs) with Fe impurities was prepared on a glass substrate
by the ion sputtering technique. Ion irradiation effects on this multilayer were studied …
by the ion sputtering technique. Ion irradiation effects on this multilayer were studied …
Determining chemically and spatially resolved atomic profile of low contrast interface structure with high resolution
M Nayak, PC Pradhan, GS Lodha, A Sokolov… - Scientific reports, 2015 - nature.com
We present precise measurements of atomic distributions of low electron density contrast at
a buried interface using soft x-ray resonant scattering. This approach allows one to construct …
a buried interface using soft x-ray resonant scattering. This approach allows one to construct …