A survey of run-to-run control for batch processes

K Liu, YQ Chen, T Zhang, S Tian, X Zhang - ISA transactions, 2018 - Elsevier
Abstract Run-to-run (R2R) control is widely used in semiconductor manufacturing systems to
minimize the process drift, shift and variability. The R2R controller adjusts control actions or …

Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller

CF Chien, YJ Chen, CY Hsu… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
As semiconductor manufacturing reaching nanotechnology, to obtain high resolution and
alignment accuracy via minimizing overlay errors within the tolerance is crucial. To address …

Adaptive weight tuning of EWMA controller via model-free deep reinforcement learning

Z Ma, T Pan - IEEE Transactions on Semiconductor …, 2022 - ieeexplore.ieee.org
Exponentially weighted moving average (EWMA) controllers have been extensively studied
for run-to-run (RtR) control in semiconductor manufacturing processes. However, the EWMA …

A processing quality prognostics scheme for plasma sputtering in TFT-LCD manufacturing

YC Su, MH Hung, FT Cheng… - IEEE Transactions on …, 2006 - ieeexplore.ieee.org
A novel quality prognostics scheme (QPS) for plasma sputtering in TFT-LCD manufacturing
processes is proposed. The QPS consists of a conjecture model and a prediction model. The …

Gaussian process regression for virtual metrology-enabled run-to-run control in semiconductor manufacturing

J Wan, S McLoone - IEEE Transactions on Semiconductor …, 2017 - ieeexplore.ieee.org
Incorporating virtual metrology (VM) into run-to-run (R2R) control enables the benefits of
R2R control to be maintained while avoiding the negative cost and cycle time impacts of …

Run-to-run control of batch production process in manufacturing systems based on online measurement

D Huang, J Lv - Computers & Industrial Engineering, 2020 - Elsevier
Run-to-run control is an important and effective method for quality control of batch
production process in manufacturing systems. Most of current run-to-run control methods are …

Reinforcement learning for process control with application in semiconductor manufacturing

Y Li, J Du, W Jiang - IISE Transactions, 2024 - Taylor & Francis
Process control is widely discussed in the manufacturing process, especially in
semiconductor manufacturing. Due to unavoidable disturbances in manufacturing, different …

MFRL-BI: Design of a model-free reinforcement learning process control scheme by using Bayesian inference

Y Li, J Du, W Jiang, F Tsung - IISE Transactions, 2024 - Taylor & Francis
Abstract Design of the process control scheme is critical for quality assurance to reduce
variations in manufacturing systems. Taking semiconductor manufacturing as an example …

Stochastic control of multilayer overlay in lithography processes

Y Jiao, D Djurdjanovic - IEEE transactions on semiconductor …, 2011 - ieeexplore.ieee.org
The multilayer overlay lithography process is one of the most important steps in
semiconductor manufacturing. It is a multistage manufacturing process in which errors are …

Run-to-run process adjustment using categorical observations

K Wang, F Tsung - Journal of Quality Technology, 2007 - Taylor & Francis
When quality characteristics cannot be measured on a continuous scale due to either
inherent or outside constraints, qualitative observations can be collected alternatively. Under …