As semiconductor manufacturing reaching nanotechnology, to obtain high resolution and alignment accuracy via minimizing overlay errors within the tolerance is crucial. To address …
Z Ma, T Pan - IEEE Transactions on Semiconductor …, 2022 - ieeexplore.ieee.org
Exponentially weighted moving average (EWMA) controllers have been extensively studied for run-to-run (RtR) control in semiconductor manufacturing processes. However, the EWMA …
YC Su, MH Hung, FT Cheng… - IEEE Transactions on …, 2006 - ieeexplore.ieee.org
A novel quality prognostics scheme (QPS) for plasma sputtering in TFT-LCD manufacturing processes is proposed. The QPS consists of a conjecture model and a prediction model. The …
J Wan, S McLoone - IEEE Transactions on Semiconductor …, 2017 - ieeexplore.ieee.org
Incorporating virtual metrology (VM) into run-to-run (R2R) control enables the benefits of R2R control to be maintained while avoiding the negative cost and cycle time impacts of …
Run-to-run control is an important and effective method for quality control of batch production process in manufacturing systems. Most of current run-to-run control methods are …
Y Li, J Du, W Jiang - IISE Transactions, 2024 - Taylor & Francis
Process control is widely discussed in the manufacturing process, especially in semiconductor manufacturing. Due to unavoidable disturbances in manufacturing, different …
Y Li, J Du, W Jiang, F Tsung - IISE Transactions, 2024 - Taylor & Francis
Abstract Design of the process control scheme is critical for quality assurance to reduce variations in manufacturing systems. Taking semiconductor manufacturing as an example …
Y Jiao, D Djurdjanovic - IEEE transactions on semiconductor …, 2011 - ieeexplore.ieee.org
The multilayer overlay lithography process is one of the most important steps in semiconductor manufacturing. It is a multistage manufacturing process in which errors are …
K Wang, F Tsung - Journal of Quality Technology, 2007 - Taylor & Francis
When quality characteristics cannot be measured on a continuous scale due to either inherent or outside constraints, qualitative observations can be collected alternatively. Under …