Lateral force microscopy (LFM) is a variation of atomic/scanning force microscopy
(AFM/SFM). It relies on the torsional deformation of the AFM cantilever that results from the …

A general introduction to surface and interfacial forces, perfectly combining theoretical
concepts, experimental techniques and practical applications. In this completely updated …

Atomic force microscopy (AFM) is a useful tool, not only for imaging but also for
quantification of normal and lateral forces exerted on the AFM tip while interacting with the …

Two methods commonly used to measure the normal spring constants of atomic force
microscope cantilevers are the added mass method of Cleveland et al. JP Cleveland et al …

An improved wedge calibration method for quantitative lateral force measurement in atomic
force microscopy is presented. The improved method differs from the original one in several …

The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case,
atomic) topographical analysis, applicable to both conducting and nonconducting surfaces …

In this chapter, we describe the static and dynamic normal forces that occur between
surfaces in vacuum or liquids and the different modes of friction that can be observed …

A number of atomic force microscopy cantilevers have been exhaustively calibrated by a
number of techniques to obtain both normal and frictional force constants to evaluate the …

We have designed and tested a new, inexpensive, easy-to-make and easy-to-use
calibration standard for atomic force microscopy (AFM) lateral force measurements. This …

Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for
non-destructive surface characterization with sub-molecular resolution. The AFM has also …