Conformality in atomic layer deposition: Current status overview of analysis and modelling

V Cremers, RL Puurunen, J Dendooven - Applied Physics Reviews, 2019 - pubs.aip.org
Atomic layer deposition (ALD) relies on alternated, self-limiting reactions between gaseous
reactants and an exposed solid surface to deposit highly conformal coatings with a thickness …

Status and prospects of Al2O3-based surface passivation schemes for silicon solar cells

G Dingemans, WMM Kessels - … of Vacuum Science & Technology A, 2012 - pubs.aip.org
The reduction in electronic recombination losses by the passivation of silicon surfaces is a
critical enabler for high-efficiency solar cells. In 2006, aluminum oxide (Al 2 O 3) nanolayers …

Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends

V Miikkulainen, M Leskelä, M Ritala… - Journal of Applied …, 2013 - pubs.aip.org
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely
suitable for depositing uniform and conformal films on complex three-dimensional …

Plasma-assisted atomic layer deposition: basics, opportunities, and challenges

HB Profijt, SE Potts, MCM Van de Sanden… - Journal of Vacuum …, 2011 - pubs.aip.org
Plasma-assisted atomic layer deposition (ALD) is an energy-enhanced method for the
synthesis of ultra-thin films with Å-level resolution in which a plasma is employed during one …

Silicon surface passivation by atomic layer deposited Al2O3

B Hoex, J Schmidt, P Pohl… - Journal of Applied …, 2008 - pubs.aip.org
Thin Al 2 O 3 films with a thickness of 7–30 nm synthesized by plasma-assisted atomic layer
deposition (ALD) were used for surface passivation of crystalline silicon (c-Si) of different …

Atomic layer deposition

M Ritala, M Leskelä - Handbook of Thin Films, 2002 - Elsevier
Publisher Summary This chapter deals with atomic layer deposition (ALD), which is a
chemical gas phase thin film deposition method based on alternate saturative surface …

Surface passivation of high‐efficiency silicon solar cells by atomic‐layer‐deposited Al2O3

J Schmidt, A Merkle, R Brendel, B Hoex… - Progress in …, 2008 - Wiley Online Library
Atomic‐layer‐deposited aluminium oxide (Al2O3) is applied as rear‐surface‐passivating
dielectric layer to passivated emitter and rear cell (PERC)‐type crystalline silicon (c‐Si) solar …

Excellent passivation of highly doped p-type Si surfaces by the negative-charge-dielectric Al2O3

B Hoex, J Schmidt, R Bock, PP Altermatt… - Applied Physics …, 2007 - pubs.aip.org
From lifetime measurements, including a direct experimental comparison with thermal Si O
2⁠, a-Si: H⁠, and as-deposited a-Si N x: H⁠, it is demonstrated that Al 2 O 3 provides an …

In situ spectroscopic ellipsometry as a versatile tool for studying atomic layer deposition

E Langereis, SBS Heil, HCM Knoops… - Journal of Physics D …, 2009 - iopscience.iop.org
In this paper recent work on the application of in situ spectroscopic ellipsometry (SE) during
thin film synthesis by atomic layer deposition (ALD) is reviewed. In particular, the versatility …

19%‐efficient and 43 µm‐thick crystalline Si solar cell from layer transfer using porous silicon

JH Petermann, D Zielke, J Schmidt… - Progress in …, 2012 - Wiley Online Library
We present a both‐sides‐contacted thin‐film crystalline silicon (c‐Si) solar cell with a
confirmed AM1. 5 efficiency of 19.1% using the porous silicon layer transfer process. The …