G Dingemans, WMM Kessels - … of Vacuum Science & Technology A, 2012 - pubs.aip.org
The reduction in electronic recombination losses by the passivation of silicon surfaces is a critical enabler for high-efficiency solar cells. In 2006, aluminum oxide (Al 2 O 3) nanolayers …
Atomic layer deposition (ALD) is gaining attention as a thin film deposition method, uniquely suitable for depositing uniform and conformal films on complex three-dimensional …
Plasma-assisted atomic layer deposition (ALD) is an energy-enhanced method for the synthesis of ultra-thin films with Å-level resolution in which a plasma is employed during one …
B Hoex, J Schmidt, P Pohl… - Journal of Applied …, 2008 - pubs.aip.org
Thin Al 2 O 3 films with a thickness of 7–30 nm synthesized by plasma-assisted atomic layer deposition (ALD) were used for surface passivation of crystalline silicon (c-Si) of different …
M Ritala, M Leskelä - Handbook of Thin Films, 2002 - Elsevier
Publisher Summary This chapter deals with atomic layer deposition (ALD), which is a chemical gas phase thin film deposition method based on alternate saturative surface …
J Schmidt, A Merkle, R Brendel, B Hoex… - Progress in …, 2008 - Wiley Online Library
Atomic‐layer‐deposited aluminium oxide (Al2O3) is applied as rear‐surface‐passivating dielectric layer to passivated emitter and rear cell (PERC)‐type crystalline silicon (c‐Si) solar …
From lifetime measurements, including a direct experimental comparison with thermal Si O 2, a-Si: H, and as-deposited a-Si N x: H, it is demonstrated that Al 2 O 3 provides an …
E Langereis, SBS Heil, HCM Knoops… - Journal of Physics D …, 2009 - iopscience.iop.org
In this paper recent work on the application of in situ spectroscopic ellipsometry (SE) during thin film synthesis by atomic layer deposition (ALD) is reviewed. In particular, the versatility …
JH Petermann, D Zielke, J Schmidt… - Progress in …, 2012 - Wiley Online Library
We present a both‐sides‐contacted thin‐film crystalline silicon (c‐Si) solar cell with a confirmed AM1. 5 efficiency of 19.1% using the porous silicon layer transfer process. The …