[PDF][PDF] A self-adaptive resilient method for implementing and managing the high-reliability processing system
J Chen - 2023 - researchgate.net
As a result of CMOS scaling, radiation-induced Single-Event Effects (SEEs) in electronic
circuits became a critical reliability issue for modern Integrated Circuits (ICs) operating under …
circuits became a critical reliability issue for modern Integrated Circuits (ICs) operating under …
Design of ASIC and FPGA system with Supervised Machine Learning Algorithms for Solar Particle Event Hourly Prediction
The magnitude of soft error rate (SER) of integrated circuits (ICs) utilized in space missions
is jeopardized due to the inconsistent intensity of radiation exposure. To protect critical …
is jeopardized due to the inconsistent intensity of radiation exposure. To protect critical …