We investigated scaling of the atmospheric neutron soft error rate (SER) which affects
reliability of CMOS circuits at ground level and airplane flight altitudes. We considered …

Radiation-induced single event upsets (SEUs) pose a major challenge for the design of
memories and logic circuits in high-performance microprocessors in technologies beyond …

A unique circuit hardening technique is described, which can totally eliminate both alpha
and neutron induced soft errors from deep submicron microcircuits. This hardening …

Silicon is used in radiation detectors and electronic devices. Nowadays, these devices
achieving submicron technology are parts of integrated circuits of large to very large scale …

We present a new method to estimate Single Event Upsets (SEU) in a hadron accelerator
environment, which is characterized by a complicated radiation spectrum. Our method is …

High fault tolerance for transient faults and low-power consumption are key objectives in the
design of critical embedded systems. Systems like smart cards, PDAs, wearable computers …

The Burst Generation Rate (BGR) method, originally developed to calculate single event
upset (SEU) rates in microelectronics due to neutrons and protons, has been extended for …

Various SRAM and MOSFET devices were exposed to 3 MeV and 14 MeV neutrons at a
fusion facility and to a fission neutron spectrum with a californium-252 source. Single event …

Quantifying the Double-Sided Neutron SEU Threat, From Low Energy (Thermal) and High
Energy (<formula formulatype="inline Page 1 IEEE TRANSACTIONS ON NUCLEAR SCIENCE …

A new approach for SEU rate prediction in components submitted to neutron environment is
presented. The method aims to take into account the characteristics of the secondary …