Near-field infrared spectroscopy: Advanced research method in thin film analysis

J Kim, B Chae, S Lee - Current Applied Physics, 2024 - Elsevier
This article introduces several cases of s-SNOM (Scattering-type scanning near-field optical
microscopy) based on a SPM (Scanning probe microscopy) for chemical thin film. A highly …

Metastable marvels: Navigating VO2 polymorphs for next-gen electronics and energy solutions

N Vishwakarma, AA Remadevi, D Kumar… - Journal of Applied …, 2024 - pubs.aip.org
VO 2 polymorphs present a unique opportunity to unravel diverse electronic properties
possessed by their metastable phases. A highly reproducible, single-phase, and …

Nanoscale Enhancement of the Local Optical Conductivity near Cracks in Metallic SrRuO3 Film

CJ Roh, EK Ko, Y Chang, SH Park, J Mun, M Kim… - ACS …, 2023 - ACS Publications
Cracking has been recognized as a major obstacle degrading material properties, including
structural stability, electrical conductivity, and thermal conductivity. Recently, there have …

Crystallinity-dependent surface oxidation in Cu Films revealed by a visualization of surface plasmon

MS Kim, JS Kim, BN Chae, JS Lee - Current Applied Physics, 2025 - Elsevier
We visualized surface plasmon in poly-and single-crystalline Cu films by exploiting nano-
infrared imaging. We clearly observed oscillating patterns in both films which are attributed …

Effect of Ar pressure on phase transition characteristics and charge transport mechanism in VO2 films grown by RF sputtering of V2O5

AK Singh, HK Singh, PK Siwach - Physica Scripta, 2024 - iopscience.iop.org
In this study, we report the growth and characterization of VO 2 films deposited on YSZ (001)
substrate employing RF magnetron sputtering of vanadium pentoxide (V 2 O 5) target in …