A hyper-heuristic inspired approach for automatic failure prediction in the context of industry 4.0

A Navajas-Guerrero, D Manjarres, E Portillo… - Computers & Industrial …, 2022 - Elsevier
In the era of technological advances and Industry 4.0, massive data collection and analysis
is a common approach followed by many industries and companies worldwide. One of the …

Cross-chamber data transferability evaluation for fault detection and classification in semiconductor manufacturing

F Zhu, X Jia, W Li, M Xie, L Li… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Unit-to-unit variation among the production chambers is a long-lasting challenge for Fault
Detection and Classification (FDC) development in the semiconductor industry. Currently …

Profile Abstract: an optimization-based subset selection and summarization method for profile data mining

F Zhu, J Feng, M Xie, L Li, J Lei… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Nowadays, profile data mining techniques facilitate effective process monitoring, quality
control, fault diagnosis, etc., with considerable benefits to manufacturing industry. However …

Data-Driven Decision-Making in Shop Floor Quality Management–A Systematic Literature Review

M Schamberger, M Breu, F Bodendorf - International Conference on …, 2024 - Springer
This paper presents a systematic literature review of applied methods for data-driven
decision-making (DDD) in shop floor quality management (QM). The goal is to give an …

Trace Abstraction: A Novel Method to Enhance Fault Detection in Semiconductor Manufacturing Processes with An Optimization Approach

J Feng, F Zhu, Z Liu, J Zhang, L Hua… - … Global Reliability and …, 2021 - ieeexplore.ieee.org
In today's semiconductor manufacturing industry, fault detection (FD) and classification
(FDC) techniques are usually leveraged for equipment health monitoring (EHM) and …

Combining Feature Extraction-Based and Full Trace Analysis Capabilities in Fault Detection: Methods and Comparative Analysis

F Li, H Cai, J Moyne, J Iskandar… - 2021 32nd Annual …, 2021 - ieeexplore.ieee.org
As semiconductor manufacturing processes become more complex and sophisticated,
manufacturers demand high quality, efficient process monitoring and fault detection (FD) …

[HTML][HTML] Failure Prediction in the Context of Industry 4.0 Last updated Oct 1, 2021

D Manjarrés - eu-japan.ai
In the era of Industry 4.0, Machine Learning (ML) technologies are viewed as the main
potential tools for analysing the huge amount of data collected by industries and predict …

Reproducible Prognostic and Health Management for Complex Industrial System using Human-AI Collaboration

F Li - 2021 - search.proquest.com
Abstract Prognostics and Health Management (PHM) system is facing new challenges in
reproducing consistent results in different industrial scenarios in the current industry …

[HTML][HTML] Failure Prediction in the Context of Industry 4.0 Last updated 10 月1, 2021

D Manjarrés - eu-japan.ai
In the era of Industry 4.0, Machine Learning (ML) technologies are viewed as the main
potential tools for analysing the huge amount of data collected by industries and predict …