Applications of artificial neural networks in chemical engineering

DM Himmelblau - Korean journal of chemical engineering, 2000 - Springer
A growing literature within the field of chemical engineering describing the use of artificial
neural networks (ANN) has evolved for a diverse range of engineering applications such as …

Automatic control in microelectronics manufacturing: Practices, challenges, and possibilities

TF Edgar, SW Butler, WJ Campbell, C Pfeiffer, C Bode… - Automatica, 2000 - Elsevier
Advances in modeling and control will be required to meet future technical challenges in
microelectronics manufacturing. The implementation of closed-loop control on key unit …

Modelling the spice parameters of SOI MOSFET using a combinational algorithm

M Sarvaghad-Moghaddam, AA Orouji, Z Ramezani… - Cluster …, 2019 - Springer
Progress in the technology of submicron semiconductor device, which makes a short-
channel and quantum effects, having equations of nonlinear modelling, leads to complicated …

New symmetric and planar designs of reversible full-adders/subtractors in quantum-dot cellular automata

M Sarvaghad-Moghaddam, AA Orouji - The European Physical Journal D, 2019 - Springer
Abstract Quantum-dot Cellular Automata (QCA) is one of the emerging nanotechnologies,
promising an alternative to CMOS technology due to a faster speed, smaller size, lower …

Modeling plasma surface modification of textile fabrics using artificial neural networks

R Abd Jelil, X Zeng, L Koehl, A Perwuelz - Engineering Applications of …, 2013 - Elsevier
In this paper, a neural network approach is used to understand the effects of fabric features
and plasma processing parameters on fabric surface wetting properties. In this approach …

Feedforward neural network trained by BFGS algorithm for modeling plasma etching of silicon carbide

JH Xia, AS Kumta - IEEE transactions on plasma science, 2010 - ieeexplore.ieee.org
Electron cyclotron resonance (ECR) plasma etching of silicon carbide is numerically
modeled by a feedforward neural network (FNN), which is trained by the Broyden, Fletcher …

Monitoring and control of semiconductor manufacturing processes

S Limanond, J Si, K Tsakalis - IEEE Control Systems Magazine, 1998 - ieeexplore.ieee.org
Concerns optical measurement techniques for semiconductor manufacturing process
monitoring and control. They can provide previously impossible real-time monitoring of …

Real-time diagnosis of semiconductor manufacturing equipment using a hybrid neural network expert system

B Kim, GS May - IEEE Transactions on Components, Packaging …, 1997 - ieeexplore.ieee.org
This paper presents a tool for the real-time diagnosis of integrated circuit fabrication
equipment. The approach focuses on integrating neural networks into an expert system. The …

Using neural network process models to perform PECVD silicon dioxide recipe synthesis via genetic algorithms

SS Han, GS May - IEEE transactions on semiconductor …, 1997 - ieeexplore.ieee.org
Silicon oxide (SiO/sub 2/) films have extensive applications in integrated circuit fabrication
technology, including passivation layers for integrated circuits, diffusion or photolithographic …

Comprehensive simulation of the effects of process conditions on plasma enhanced chemical vapor deposition of silicon nitride

M Bavafa, H Ilati, B Rashidian - Semiconductor science and …, 2008 - iopscience.iop.org
A numerical model for the deposition of silicon nitride using silane and ammonia mixture in a
radio frequency plasma reactor has been developed. Plasma enhanced chemical vapor …